Novel non-contact infrared temperature measuring probe

An infrared temperature measurement probe, non-contact technology, applied in the direction of measuring device, optical radiation measurement, radiation pyrometry, etc., can solve the problems of inconvenient positioning and adjustment, easy to be interfered, etc., to achieve convenient search, convenient measurement position, The effect of improving accuracy

Inactive Publication Date: 2019-01-01
扬州普瑞森科技有限公司
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Problems solved by technology

[0003] However, there are some limitations in the existing temperature measuring probes, because it is inconvenient to install temperature measuring probes on some process equipment for measurement, so we will switch to non-contact infrared temperature measuring probes for measurement. The temperature measuring probe can determine the surface temperature by measuring the infrared energy radiated from the target surface, which is more convenient to use, but it also has some disadvantages, such as inconvenient positioning adjustment, easy to be interfered, etc.

Method used

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  • Novel non-contact infrared temperature measuring probe

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Embodiment Construction

[0020] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0021] see Figure 1-4 The invention provides a technical solution:

[0022] A new type of non-contact infrared temperature measuring probe, its structure includes a probe body 1 and a mounting bracket 2, the outside of the probe body 1 is provided with a mounting thread 3, and the mounting thread 3 is sleeved with a double nut 4, A mounting bracket 2 is fixed between the double nuts 4, a fixing bolt 6 is connected to the lower end of the mounting bracket 2, ...

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Abstract

The invention discloses a novel non-contact infrared temperature measuring probe. The structure of the probe comprises a probe body and an installing bracket. The outer side of the probe body is provided with installing threads. Double nuts sleeve on the installing threads. The installing bracket is fixedly arranged between the double nuts. A fixing bolt is connected on the lower end of the installing bracket. A lead is connected on the right end of the probe body. A power supply line and a signal transmission line are wrapped in the inner side of the lead. The lower side of the lead is provided with a work indicating lamp and a laser switch. The left end of the probe body is provided with a groove which is internally provided with a Fresnel lens. A photoelectric detector is connected on the inner side of the Fresnel lens. The photoelectric detector is arranged inside the probe body. The right side of the photoelectric detector is respectively provided with an electrothermal stack infrared temperature sensor and a signal processing circuit board. The novel non-contact infrared temperature measuring probe is simple in structure, convenient to install and disassemble, accurate in locating, convenient to adjust the angle of the probe, stable in measurement and long in service life.

Description

technical field [0001] The invention relates to the technical field of temperature measuring devices, in particular to a novel non-contact infrared temperature measuring probe. Background technique [0002] Temperature is a physical quantity that measures the degree of coldness and heat of an object. It is a very common and important thermal parameter in industrial production. Many production processes require monitoring and control of temperature, especially in the production process of chemical, food and other industries. , The measurement and control of temperature directly affects the quality and performance of the product. Therefore, we often use temperature measuring probes for temperature measurement. [0003] However, there are some limitations in the existing temperature measuring probes, because it is inconvenient to install temperature measuring probes on some process equipment for measurement, so we will switch to non-contact infrared temperature measuring probe...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J5/04G01J5/06G01J5/02
CPCG01J5/04G01J5/02G01J5/06
Inventor 王美祖
Owner 扬州普瑞森科技有限公司
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