Novel non-contact infrared temperature measuring probe
An infrared temperature measurement probe, non-contact technology, applied in the direction of measuring device, optical radiation measurement, radiation pyrometry, etc., can solve the problems of inconvenient positioning and adjustment, easy to be interfered, etc., to achieve convenient search, convenient measurement position, The effect of improving accuracy
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[0020] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0021] see Figure 1-4 The invention provides a technical solution:
[0022] A new type of non-contact infrared temperature measuring probe, its structure includes a probe body 1 and a mounting bracket 2, the outside of the probe body 1 is provided with a mounting thread 3, and the mounting thread 3 is sleeved with a double nut 4, A mounting bracket 2 is fixed between the double nuts 4, a fixing bolt 6 is connected to the lower end of the mounting bracket 2, ...
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