Automatic test system and method for GHz analog-to-digital converter

Abstract

The invention provides an automatic test system and method for a GHz analog-to-digital converter. The automatic test system for a GHz analog-to-digital converter mainly includes a DC power supply analyzer, two signal sources, a clock source, a switching filter bank, a logic analyzers, an SPI control module, a test evaluation board, a switch, a test server, a display, and a cabinet, wherein the SPIcontrol module is connected to the test server through a USB cable, and each virtual instrument and the test server are arranged in the cabinet after being connected to the switch through an LAN bus;and based on TestStand and LabView, a host computer software is compiled to complete the control of the each virtual instrument and each module and evaluation of the full parameter characteristics ofthe converter, and then the test results are saved and displayed on the display, and the automatic test of the GHz analog-to-digital converter is finally realized. The automatic test system and method for a GHz analog-to-digital converter can simplify the testing process, can increase the number of measurable parameters of the GHz analog-to-digital converter, can improve the testing efficiency, and can reduce the maintenance cost of the test system software, and at the same time, the automatic test system has preferable compatibility and flexibility.

Description

technical field [0001] The invention relates to an automatic testing system and method for a gigahertz analog-to-digital converter, belonging to the technical field of analog-to-digital converters. Background technique [0002] Gigahertz analog-to-digital converters are widely used in missiles, satellites, aerospace, civil consumer electronics and other fields. With the continuous improvement of the performance index of converter products, requirements are put forward for test reliability and test efficiency. In response to these needs, many companies in the industry use automated test equipment (ATE) to quickly evaluate converter performance indicators. [0003] However, ATE equipment testing is expensive and requires the development of test system software for different types of gigahertz analog-to-digital converter products. It is difficult to meet the needs of function expansion and test parameter increase in the actual test process, which affects the test efficiency of...

AI Technical Summary

Problems solved by technology

[0003] However, ATE equipment testing is expensive and requires the development of test system software for different types of GHz ADC products. It is difficult to meet the requirements of function expansion and test parameter increase in the actual test process, which affects the test efficiency of products.

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