X-band MEMS phase shifter performance prediction method based on thermal environment and bridge material properties
A technology for predicting material properties and performance, applied in instruments, special data processing applications, electrical digital data processing, etc., can solve problems such as detachment, MEMS bridge height error, MEMS bridge temperature change, etc.
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[0051] The present invention will be further described below in conjunction with the drawings and embodiments.
[0052] Reference figure 1 , The present invention is a method for predicting the performance of an X-band MEMS phase shifter based on the thermal environment and the properties of the bridge material. The specific steps are as follows:
[0053] Step 1. Determine the structural parameters, material properties and electromagnetic operating parameters of the MEMS phase shifter.
[0054] MEMS phase shifter structure parameters such as figure 2 Shown includes the length, width and thickness of the coplanar waveguide transmission line, MEMS bridge and dielectric layer, as well as the distance between two adjacent bridges and the height of the MEMS bridge from the dielectric layer; the material properties of the MEMS phase shifter, including the relative dielectric layer Dielectric constant; the electromagnetic operating parameters of the MEMS phase shifter, including the electr...
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