Oscilloscope and image processing method thereof
An image processing and oscilloscope technology, used in instruments, measuring devices, measuring electrical variables, etc., can solve problems such as the temperature change curve that cannot reflect the target components, and achieve the effect of troubleshooting circuit design problems
Active Publication Date: 2019-01-15
UNI TREND TECH (CHINA) CO LTD
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[0003] In view of the above problems, the object of the present invention is to provide an oscilloscope combined with a thermal imager and an image processing method thereof, in which algorithms such as infrared temperature compensation and correction are embedded in the traditional oscilloscope to analyze the infrared thermal radiation data received by the front-end thermal imager, It is used to solve the problem that thermal imagers and oscilloscopes in the prior art cannot reflect the temperature change curve of the target component in unit time, and the change curve of the target temperature and its electrical signal
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[0040] The present invention will be described in detail below in conjunction with the accompanying drawings and embodiments.
[0041] An embodiment of the present invention provides an oscilloscope, such as figure 1 As shown, the oscilloscope includes: a front-end data receiving system for collecting the infrared radiation of the surface of the measured target, a back-end data processing system for communicating with the front-end data receiving system and performing data processing and display, and a power supply for the above-mentioned system system.
[0042] The front-end data receiving system includes: a thermal imaging sensor module 101, which is used to sense the infrared thermal radiation on the surface of the measured target, and converts the infrared thermal radiation into the original data of the thermal image; a front-end processor 102, which communicates with the thermal imaging sensor module Group 101 communicates to obtain the thermal image and the original tem...
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The invention relates to an oscilloscope and an image processing method thereof. The oscilloscope comprises a data receiving unit used for receiving thermal image data; a parsing unit used for parsingthe received thermal image data to obtain a thermogram; a calculation unit for calculating temperature data of each pixel of the thermogram and performing algorithm compensation to make the temperature data more accurate; a positioning unit used for comparing the temperature of each pixel of the thermogram with a standard temperature reference value, and positioning abnormal temperature points; and a display unit used for displaying the thermogram and the abnormal temperature points. The oscilloscope can observe a change curve of the temperature of a target component within unit time, and canalso observe a change curve of the temperature of the target component and a voltage signal of the target component, so that an electronics engineer can be facilitated to analyze a change relationship of the performance of the component that is influenced by the temperature, thereby troubleshooting circuit design problems.
Description
technical field [0001] The invention belongs to the field of circuit detection, and in particular relates to an oscilloscope and an image processing method thereof. Background technique [0002] At present, traditional digital oscilloscopes have waveform analysis functions for general circuit signals, but when there is a short circuit in the circuit, the power of components is too large, and the power utilization rate is too low, it is often difficult to locate and analyze. The traditional thermal imager, although it can analyze the local temperature through the thermal image, and then analyze the temperature of the specific target components, but it cannot analyze the specific circuit problems through the thermal image, nor can it observe the temperature change of the target component within a unit time. Curve, as well as the change curve of the target temperature and its electrical signal, so that electronic engineers cannot analyze the change curve of component performanc...
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IPC IPC(8): G01R35/00
CPCG01R35/00
Inventor 胡明蔡伟明金占华陈闰
Owner UNI TREND TECH (CHINA) CO LTD