A sample cartridge for carrying an atomic probe needle-like sample

Abstract

The invention discloses a sample box, a lid, a box body, a clasp, a lofting platform, a shock absorber, a lofting round hole, a screw, a screw hole, a stud and a sealing ring used for loading an atomic probe needle-like sample; the sample box comprises a lid, a box body, a clasp, a lofting platform, a shock absorber, a lofting round hole, a screw, a screw hole and a sealing ring. Wherein the box cover is fastened with the box body through a sealing ring and a clasp, the lofting platform is fixedly connected with the top of the box body, a shock absorber is arranged at the bottom of the box body, a plurality of lofting round holes are arranged on the top of the lofting platform, the lofting round holes are arranged in two circles of concentric circles at equal angles on the lofting platform, and the inner layer and the outer layer round holes are staggered at angles; At that side of the loft platform, a screw hole is arranged correspondingly to each loft round hole, and the screw hole is correspondingly provided with a screw post for fixing; The lofting round holes arranged on the lofting platform are arranged at equal angles of two concentric circles, and the inner layer and the outer layer round holes are staggered by a certain angle, so as to be convenient for taking and placing samples and avoid tweezers from accidentally touching other samples and causing sample damage in the process of taking and placing samples.

Description

technical field [0001] The invention relates to a sample box for loading needle-shaped samples of atomic probes, belonging to the technical field of sample collection devices. Background technique [0002] Since the diameter of the tip of the atom probe sample is only about 100nm, it is very fragile, and it is very likely to cause damage to the sample when it is subjected to external forces during storage and movement, so it cannot be used for atom probe experiments. The sample cannot be placed in the natural environment for a long time, and it is prone to oxidation, which will cause the state of the sample to change, which is not conducive to the atom probe experiment. Contents of the invention [0003] In order to make up for the defects of the prior art, the present invention provides a sample box for loading atom probe needle-shaped samples that can avoid damage to the sample during storage and moving, and can facilitate sample management. [0004] The present inventi...

AI Technical Summary

Problems solved by technology

[0002] Since the tip diameter of the atom probe sample is only about 100nm, it is very fragile, and it is very likely to cause damage to the sample when it is subjected to external forces during storage and movement, and cannot be used for atom probe experiments.

The sample cannot be placed in the natural environment for a long time, and it is prone to oxidation, which will cause the state of the sample to change, which is not conducive to the atom probe experiment

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