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Defect detection method, device, computer device and storage medium

A defect detection and defect technology, applied in the computer field, can solve the problems of poor detection effect, low efficiency, large amount of calculation, etc., and achieve the effect of speeding up the detection processing time, accurate detection, and improving efficiency

Active Publication Date: 2019-02-01
SHENZHEN ZVIT TECH CO LTD
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  • Abstract
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Problems solved by technology

Although there are many traditional defect detection methods, either the detection effect is not good, or the calculation is large and the efficiency is low

Method used

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  • Defect detection method, device, computer device and storage medium
  • Defect detection method, device, computer device and storage medium
  • Defect detection method, device, computer device and storage medium

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Embodiment Construction

[0049] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0050] Such as figure 1 As shown, a defect detection method is proposed, which can be applied not only to a terminal but also to a server. This embodiment uses the terminal as an example for illustration. The defect detection method specifically includes the following steps:

[0051] Step 102, acquiring a target image corresponding to the target subject to be detected.

[0052] Wherein, the target subject refers to a target object to be detected for defects, and the target image refers to an image of the target subject. The target image can be a color image, a gray image, or a binarized image. ...

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Abstract

A method for detect defects The method comprises: obtaining a target image corresponding to a target subject to be detected, Gaussian difference process is performed on that target image to obtain a Gaussian difference image, when it is determined from the Gaussian difference image that there are a plurality of defects in the target body, acquiring a position of each defect in the target image, calculating a degree of overlap between two defects according to the position of each defect, merging the defects according to the degree of overlap, and determining merged target defect information corresponding to the target subject. In addition, a defect detection device, a computer device and a storage medium are also provided.

Description

technical field [0001] The present invention relates to the field of computer technology, in particular to a defect detection method, device, computer equipment and storage medium. Background technique [0002] In industrial production, it is necessary to perform defect detection on the produced products. For example, after the textile industry produces cloth, it is necessary to detect whether there are defects or defects in the cloth, so as to facilitate timely repair and improve the quality of the cloth. Although there are many traditional defect detection methods, either the detection effect is not good, or the calculation is large and the efficiency is low. Therefore, there is an urgent need to propose a defect detection method with high efficiency and good effect. Contents of the invention [0003] Based on this, it is necessary to provide a high-efficiency and effective defect detection method, device, computer equipment and storage medium for the above-mentioned pr...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06T7/62G06T7/70G06T5/00
CPCG06T7/0004G06T7/62G06T7/70G06T5/70
Inventor 周凯廖方诚张孟吴小飞曾江东王珂王文涛江银凤
Owner SHENZHEN ZVIT TECH CO LTD
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