Method for optimizing analog circuit measuring points based on sawtooth wave and genetic algorithm

Abstract

The invention discloses a method for optimizing analog circuit measuring points based on a sawtooth wave and a genetic algorithm. The method for optimizing the analog circuit measuring points based onthe sawtooth wave and the genetic algorithm comprises the following steps that fault simulation is carried out on each fuzzy group representative element of each element of the analog circuit for a plurality of times, and the sawtooth wave is used as an input of the analog circuit during analog to obtain fault voltages corresponding to the measuring points under different frequencies, so that analog circuit data are obtained; individuals in the genetic algorithm are initialized, the individuals are processed, then the feature vector of the corresponding measuring points from the analog circuit data is screened according to a measuring point selection scheme corresponding to the individuals, cross-verification is carried out on a preset classifier, the obtained classification accuracy rateis used as a fitness value of the individuals, then a next generation population is generated to continue processing until an iteration end condition is reached, and the individual with the greatestfitness in the current population is used as the optimal individual, and the measuring point selection scheme corresponding to the individual is a measuring point optimizing scheme. The method for optimizing the analog circuit measuring points based on the sawtooth wave and the genetic algorithm can effectively realize the measuring point optimizing and improve the accuracy of fault diagnosis whenanalog circuit fault diagnosis is carried out based on multiple frequencies.

Description

technical field [0001] The invention belongs to the technical field of analog circuit fault diagnosis, and more specifically relates to an analog circuit measuring point optimization method based on a sawtooth wave and a genetic algorithm. Background technique [0002] At present, in the field of fault diagnosis of analog circuits, the testability method based on frequency analysis has been used to select the appropriate test frequency to improve the efficiency of fault diagnosis, but not all test points and frequencies are useful, and an appropriate selection method needs to be proposed . On the other hand, due to the tolerance of analog circuit components, the ambiguity of fault diagnosis is increased, and most of the analog circuit fault diagnosis methods do not consider the influence of tolerance. [0003] In the patent "University of Electronic Science and Technology. Analog Circuit Fault Diagnosis Method Based on Sawtooth Wave: China, CN107576904A.20180112.", a sawtoo...

AI Technical Summary

Problems solved by technology

[0004] The study found that because the analog circuit has fuzzy groups at different frequencies, and changing the frequency cannot be improved, it is necessary to change the position of the measuring point or increase the number of measuring points to solve this kind of problem, and the analog circuit fault diagnosis method based on the sawtooth wave can only be used The method of increasing the frequency to improve the classification accuracy does not improve the fuzzy group problem

In addition, as the integration of analog circuits is getting higher and higher, there are fewer and fewer external measuring points, which further increases the difficulty of fault diagnosis of analog circuits.

Images