Optimizing Method of Measuring Points in Analog Circuit Based on Sawtooth Wave and Genetic Algorithm

Abstract

The invention discloses an analog circuit measuring point optimization method based on a sawtooth wave and a genetic algorithm. Multiple failure simulations are performed on the representative elements of each component fuzzy group of the analog circuit. During the simulation, the sawtooth wave is used as the input of the analog circuit to obtain different The fault voltage corresponding to each measuring point under the frequency, so as to obtain the analog circuit data; initialize the individual in the genetic algorithm, process each individual, and then filter out the corresponding measuring point from the analog circuit data according to the individual corresponding measuring point selection scheme The eigenvector is used to cross-validate the preset classifier, and the obtained classification accuracy is used as the fitness value of the individual, and then the next-generation population is generated to continue processing until the iteration end condition is reached, and the individual with the highest fitness from the current population is As the optimal individual, its corresponding measuring point selection scheme is the measuring point optimization scheme. The invention can effectively realize the optimization of measuring points when performing analog circuit fault diagnosis based on multi-frequency, and improve the accuracy of fault diagnosis.

Description

technical field [0001] The invention belongs to the technical field of analog circuit fault diagnosis, and more specifically relates to an analog circuit measuring point optimization method based on a sawtooth wave and a genetic algorithm. Background technique [0002] At present, in the field of fault diagnosis of analog circuits, the testability method based on frequency analysis has been used to select the appropriate test frequency to improve the efficiency of fault diagnosis, but not all test points and frequencies are useful, and an appropriate selection method needs to be proposed . On the other hand, due to the tolerance of analog circuit components, the ambiguity of fault diagnosis is increased, and most of the analog circuit fault diagnosis methods do not consider the influence of tolerance. [0003] In the patent "University of Electronic Science and Technology. Analog Circuit Fault Diagnosis Method Based on Sawtooth Wave: China, CN107576904A.20180112.", a sawtoo...

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Problems solved by technology

[0004] The study found that because the analog circuit has fuzzy groups at different frequencies, and changing the frequency cannot be improved, it is necessary to change the position of the measuring point or increase the number of measuring points to solve this kind of problem, and the analog circuit fault diagnosis method based on the sawtooth wave can only be used The method of increasing the frequency to improve the classification accuracy does not improve the fuzzy group problem

In addition, as the integration of analog circuits is getting higher and higher, there are fewer and fewer external measuring points, which further increases the difficulty of fault diagnosis of analog circuits.

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