A defect detection method based on defect rules and classification feedback
A technology for discovering methods and defect types, which is applied to instruments, electrical digital data processing, computing, etc., can solve problems such as lack of classification and feedback technology, and achieve the effect of improving accuracy
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[0029] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0030] combine figure 1 , the present invention proposes a defect discovery method based on defect rules and classification feedback, comprising the following steps:
[0031] Step 1. Using a static data analysis tool to extract data information in the source code under the analysis process;
[0032] The main feature of static data analysis is that the code analysis process does not depend on the execution of the program. And the data analysis can...
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