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A defect detection method based on defect rules and classification feedback

A technology for discovering methods and defect types, which is applied to instruments, electrical digital data processing, computing, etc., can solve problems such as lack of classification and feedback technology, and achieve the effect of improving accuracy

Inactive Publication Date: 2019-03-01
HARBIN ENG UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the results of defect retrieval were not better than expected
Lack of bug triage and feedback technology was the main reason

Method used

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  • A defect detection method based on defect rules and classification feedback
  • A defect detection method based on defect rules and classification feedback
  • A defect detection method based on defect rules and classification feedback

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Embodiment Construction

[0029] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0030] combine figure 1 , the present invention proposes a defect discovery method based on defect rules and classification feedback, comprising the following steps:

[0031] Step 1. Using a static data analysis tool to extract data information in the source code under the analysis process;

[0032] The main feature of static data analysis is that the code analysis process does not depend on the execution of the program. And the data analysis can...

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Abstract

The invention provides a defect discovery method based on defect rules and classification feedback, comprising the following steps: step 1, extracting data information in the source code under the analysis process by using a static data analysis tool; step 2: constructing the code analysis tree with static analysis tools and constructing each node of the code analysis tree through the set syntax rules; using code analysis tree to describe the logical structure of the source code, using 4C model to retrieve the defects of the data in the source code; 3, classify defects by use a Taxonomy classification method; Step 4, the developer judges the correctness and the incorrectness of the classified defects and gives feedback. The method can improve the accuracy of defect detection, and developers and testers can easily find these software defects.

Description

technical field [0001] The invention belongs to the technical field of software engineering, in particular to a defect discovery method based on defect rules and classification feedback. Background technique [0002] With the increasing size and complexity of software, fast and reliable defect repair becomes a major challenge of software engineering. Software testing is an important stage in software engineering, and technicians are eager to find defects accurately and quickly in source code. In recent years, many source code inspection techniques have been developed. However, the results of defect retrieval were not better than expected. The lack of defect triage and feedback technology became the main reason. In reality, it is necessary to classify these defects and consider the developer's suggestion after the defect retrieval process. Contents of the invention [0003] The purpose of the present invention is to solve the problems existing in the prior art, and prop...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
CPCG06F11/3608
Inventor 张涛徐思婕谈尤帅
Owner HARBIN ENG UNIV