Automatic test device of batch production of satellite terminals

Abstract

The invention provides an automatic test device of batch production of satellite terminals. The device comprises a test analysis controller, a switch, a signal source plate, a data processing plate, aradio frequency channel plate, a switching plate, an ATCA cabinet, an up-converter, a down-converter, a first Ka fixed attenuator, a first L-frequency-band fixed attenuator, a second Ka fixed attenuator, a second L-frequency-band fixed attenuator, and a waveguide half-divider. The test analysis controller is used for executing and transmitting forward test cases to the data processing plate; forreturned-transmission cases, radio frequency indexes are calculated through reception and analysis of an IP packet transmitted by the radio frequency channel plate, and discrimination and saving are performed; and the radio frequency channel plate is used for performing down-conversion, AD conversion and sampling on returned-transmission L-frequency-band signals according to a returned-transmission test case requirement of the test analysis controller, encapsulating sampled I and Q signal data as the IP packet and transmitting the IP packet to the test analysis controller. According to the device, automatic test of the satellite terminals at the batch production stage can be realized, the test efficiency is improved, and the test quality is guaranteed.

Description

technical field [0001] The invention belongs to the technical field of automatic testing equipment, and relates to automatic testing equipment for batch production of satellite terminals. Background technique [0002] At present, the satellite terminal supports a relatively high frequency band, and there is no RF integrated test instrument. Therefore, in the batch production stage, only single-board functions, electrical performance, and simple RF indicators can be tested, resulting in low test efficiency on the production line, and the quality cannot be effectively guaranteed; if It is difficult to implement a laboratory test environment on the production line and manual testing is inefficient. Contents of the invention [0003] The problem to be solved by the invention is that the existing satellite terminals support relatively high frequency bands, and there is no radio frequency integrated test instrument. In the batch production stage, only single-board function, elec...

AI Technical Summary

Problems solved by technology

[0003] The problem to be solved by the invention is that the existing satellite terminals support relatively high frequency bands, and there is no radio frequency integrated test instrument. In the batch production stage, only single-board function, electrical performance, and simple radio frequency indicators can be tested, resulting in low test efficiency and poor quality in the batch production stage. Problems that cannot be effectively guaranteed

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