A batch production automation test equipment for satellite terminals

Abstract

The invention provides a satellite terminal batch production automation test equipment, including: a test analysis controller, a switch, a signal source board, a data processing board, a radio frequency channel board and a switching board, an ATCA chassis, an up-converter, a down-converter, a first Ka solid attenuator, first L-band solid attenuator, second Ka solid attenuator, second L-band solid attenuator, waveguide splitter. The test analysis controller is used to execute each forward test case and send it to the data processing board; for the backhaul use case, it receives and analyzes the IP packets transmitted by the radio frequency channel board to calculate and calculate each radio frequency index, and performs criteria and storage; radio frequency The channel board is used to perform down-conversion, AD conversion, and sampling on the returned L-band signal according to the requirements of the backhaul test case of the test analysis controller, and encapsulate the sampled I and Q signal data into IP packets and send them to the test analysis controller device. The invention can realize the automatic test in the batch production stage of the satellite terminal, improve the test efficiency and ensure the test quality.

Description

technical field [0001] The invention belongs to the technical field of automatic testing equipment, and relates to automatic testing equipment for batch production of satellite terminals. Background technique [0002] At present, the satellite terminal supports a relatively high frequency band, and there is no RF integrated test instrument. Therefore, in the batch production stage, only single-board functions, electrical performance, and simple RF indicators can be tested, resulting in low test efficiency on the production line, and the quality cannot be effectively guaranteed; if It is difficult to implement a laboratory test environment on the production line and manual testing is inefficient. Contents of the invention [0003] The problem to be solved by the invention is that the existing satellite terminals support relatively high frequency bands, and there is no radio frequency integrated test instrument. In the batch production stage, only single-board function, elec...

AI Technical Summary

Problems solved by technology

[0003] The problem to be solved by the invention is that the existing satellite terminals support relatively high frequency bands, and there is no radio frequency integrated test instrument. In the batch production stage, only single-board function, electrical performance, and simple radio frequency indicators can be tested, resulting in low test efficiency and poor quality in the batch production stage. Problems that cannot be effectively guaranteed

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