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A method of dispatching workers for a testing machine

A machine and inspection station technology, applied in the field of defect inspection, can solve the problems of waiting for batch inspection, high risk of process machine monitoring, and centralized arrival of batches to the inspection station, etc., to achieve the effect of reducing monitoring risk

Active Publication Date: 2022-04-12
SHANGHAI HUALI MICROELECTRONICS CORP
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  • Abstract
  • Description
  • Claims
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AI Technical Summary

Problems solved by technology

However, in the actual production process, there will be situations where batches arrive at the inspection site in a concentrated manner or the inspection machine is down. The inspection machine cannot complete the inspection of the waiting batches within the effective time, and the production capacity of some process machines is very high. Batch waiting for too long or jumping stations will cause higher risks to the monitoring of process machines

Method used

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  • A method of dispatching workers for a testing machine

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Embodiment Construction

[0027] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments. The present invention is not limited to this embodiment, and other embodiments may also belong to the scope of the present invention as long as they conform to the gist of the present invention.

[0028] In a preferred embodiment of the present invention, based on the above-mentioned problems in the prior art, a dispatching method for inspection machines is now provided, in which the wafers waiting for inspection are sent to the inspection site in batches according to the order of dispatching In the waiting queue, and according to the waiting queue, the wafers are sequentially sent to the inspection machine in batches for defect detection, such as figure 1 shown, also includes:

[0029] Step S1, counting the number of batches accumulated in the detection site in real time, and turning to step S2 when the number of batches exceeds a preset uppe...

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Abstract

The invention provides a detection machine dispatching method, which relates to the technical field of defect detection methods in the integrated circuit manufacturing process. Counting the number of batches accumulated in the detection site; if the number of batches exceeds a preset upper limit, set a priority queue according to a preset rule, and sequentially send all batches according to the priority queue The wafers are sent to the inspection machine in batches for defect detection; if the number of batches is lower than the upper limit, the wafers are sent to the inspection machine in batches according to the above waiting queue. In-machine defect detection. The beneficial effects of the present invention are: real-time monitoring and intelligent adjustment of the machine can be carried out through the method of the present invention, thereby rationally allocating production capacity and effectively reducing monitoring risks.

Description

technical field [0001] The invention relates to the field of defect detection methods in the integrated circuit manufacturing process, in particular to a method for assigning workers to detection machines. Background technique [0002] With the development of integrated circuit manufacturing technology, the process integration is getting higher and higher, and the tolerance of products to defects is decreasing. In order to ensure the product yield, the number of defects in the production process must be strictly controlled. Therefore, the defects on the production line Inspection is an essential part of the integrated circuit manufacturing process. One of the key points of defect detection is to have timeliness. The existing defect detection method is to use the end of the batch number of the product to carry out sample sampling to ensure timeliness. However, in the actual production process, there will be situations where batches arrive at the inspection site in a concentr...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/67H01L21/66
CPCH01L21/67276H01L22/12
Inventor 袁健思韩超徐峰
Owner SHANGHAI HUALI MICROELECTRONICS CORP
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