Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A chip tantalum electrolytic capacitor test fixture

A technology of tantalum electrolytic capacitors and test fixtures, which is applied to electrolytic capacitors, capacitors, and parts of electrical measuring instruments, etc., can solve the problems of wear and tear of guide posts and guide sleeves, and poor buffering effects, so as to reduce frictional resistance and improve use Longevity and wear-reducing effects

Active Publication Date: 2021-07-16
GUIZHOU AVIC JODO TECH
View PDF15 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Aiming at the deficiencies of the prior art, the present invention provides a test fixture for chip tantalum electrolytic capacitors, which has the advantages of improving the buffering effect and reducing the wear speed of the guide post and the guide sleeve, and solves the problem that the negative electrode pressing needle in the prior art only uses a spring. Cushioning, poor cushioning effect and serious wear of guide post and guide sleeve

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A chip tantalum electrolytic capacitor test fixture
  • A chip tantalum electrolytic capacitor test fixture
  • A chip tantalum electrolytic capacitor test fixture

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0027] The technical solutions in the embodiments of the present invention will be clearly and completely described below. Obviously, the described embodiments are only some of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0028] see Figure 1-6 , a test fixture for chip tantalum electrolytic capacitors, including an upper template 1, a middle template 2, a lower template 3, a negative electrode press pin 4, a positive electrode press pin, a circuit board, a hydraulic cylinder, a press pin positioning plate and a positive electrode press pin panel, the above The specific connection relationship of the structure has been described in detail in the comparative document, and will not be repeated here. The lower surface of the middle template 2 is provide...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to the technical field of tantalum electrolytic capacitors, and discloses a test fixture for chip tantalum electrolytic capacitors, which includes an upper template, a middle template, a lower template, a negative electrode press pin, an insulating base, a positive electrode press pin, a circuit board, a hydraulic oil cylinder, and a pressure pin. Needle positioning plate and positive needle pressing panel, the lower surface of the middle template is provided with multiple buffer grooves, the negative electrode pressing needle is slidingly connected with the groove wall of the buffer groove, the upper end of the negative electrode pressing needle is fixedly connected with a telescopic rod, and the upper end of the telescopic rod is fixedly connected There is a first piston, and the same compression spring is fixedly connected between the first piston and the negative electrode indenter. The compression spring is movably sleeved on the rod wall of the telescopic rod. The groove wall of the buffer groove is symmetrically provided with two sliding grooves. The sliding connection has a second piston. The chip-type tantalum electrolytic capacitor test fixture can perform multi-stage buffering on the negative electrode pressure needle, avoiding damage to the circuit board caused by the negative electrode pressure, effectively reducing the wear of the guide post and the guide sleeve, and improving the service life of the fixture.

Description

technical field [0001] The invention relates to the technical field of production of tantalum electrolytic capacitors, in particular to a test fixture for chip-type tantalum electrolytic capacitors. Background technique [0002] Tantalum electrolytic capacitors were first successfully developed by Baylor Laboratories in the United States. Its performance is excellent, and it is the product with the smallest volume and the largest capacitance among all capacitors. Tantalum electrolytic capacitors are not only widely used in military communications, aerospace and other fields, but also widely used in industrial control, video equipment, communication instruments and other products. Tantalum electrolytic capacitors need to be tested after production, and the test requires the use of fixtures for positioning. [0003] After searching, the Chinese patent authorization number is CN202533462U patent, which discloses a chip tantalum electrolytic capacitor test fixture, including up...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R1/04H01G9/042
CPCG01R1/0408H01G9/042
Inventor 陈华飞刘英秀白红
Owner GUIZHOU AVIC JODO TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com