Device and method for measuring optical parameter field of dispersion medium based on time-frequency optical information fusion

Abstract

The invention relates to a device and method for measuring the optical parameter field of a dispersion medium based on time-frequency optical information fusion, which belongs to the technical field of optical imaging and solves the problems of small amount of acquired measurement data and low reconstruction precision of the optical parameter field when the reconstruction is performed by using measurement signals of a single model during the simultaneous reconstruction of the absorption and scattering coefficient distribution of the dispersion medium. The method comprises the steps of respectively acquiring radiation intensity information on boundaries of the dispersion medium in each direction under the action of frequency modulation laser and pulse laser by using a light field camera with a microlens array, preliminarily acquiring a reconstructed image of the optical parameter field inside the medium under the frequency domain model through simulating the infrared radiation transmission process in the dispersion medium under the action of frequency modulation laser, serving as an initial optical parameter field of the time domain model, and obtaining the internal structure of thedispersion medium through simulating the infrared radiation transmission process inside the dispersion medium under the action of pulse laser. The high-precision reconstruction of the optical parameter field can be completed by using the method of the invention.

Description

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AI Technical Summary

Benefits of technology

This patented describes a technique called Time-Frequency Optical Imaging (TFI) that combines two techniques - spectral analysis and spatial resolution. It involves measuring the scattered rays caused when transmitting electromagnetic waves within a scattering material at different angles or directions. Based upon this data, it analyzes how well they are distributed throughout its volume without being affected by other materials around them. Overall, TF allows researchers to study complex phenomena such as turbidity diffusion over large areas while also providing valuable insights into their physical properties like refractivity coefficients.

Problems solved by technology

This patents describes different techniques used during studying dispersions where there are multiple particle distributions within each space. These include measurements from microscopic observation devices like scanning electron microscopy that measure scattered intensity patterns at specific points along the surface of the material being studied. However, these conventional approaches have limitations when trying to achieve accurate results due to factors including limited resolution caused by coherence between neighboring particles' radiance fields, difficulty in calculating optimal parameters associated with this method, complexity involved in analyzing waveforms, and difficulties in accurately determining the properties of the materials under study without destructively testing them.

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