Device and method for testing LED (Light Emitting Diode) aging under multiple physics fields
A technology of aging test and multi-physics field, applied in the direction of measuring device, vibration test, optical instrument test, etc., can solve the problems of optical parameter test error, lack of reliability test, quality difference, etc., and achieve the goal of reducing the impact of high temperature Effect
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[0019] The present invention will be further described below in conjunction with the accompanying drawings.
[0020] Such as Figure 1~Figure 3 As shown, a multi-physics field LED aging test device includes an aging module, a test module and a sliding device. The aging module includes a high-temperature aging box 1, a vibration device 5, and a circuit board device 7. The vibration device 5 includes a vibrator 51 and a support column 52. The circuit board device 7 includes a circuit board support plate 71 and a circuit board 72. Several LED chips are evenly distributed on the circuit board 72 , and six LED chips are evenly distributed on the circuit board 72 in this embodiment. The lower side of the circuit board support plate 71 is connected to the fixed support plate 11 through the telescopic mechanism 12, and the fixed support plate 11 is fixedly connected to the support column 52 of the vibrating device. The telescoping mechanism 12 may be a small electric jack device. F...
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