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A system and method for accurate characterization of layered micro-defects in dark-field phase-locked thermal imaging of solar cells

A solar cell and thermal imaging technology, applied in image analysis, image data processing, image data processing, etc., can solve the problems of inability to obtain the difference of the luminous signal on the front and rear surfaces, the luminous signal cannot pass through, and the defect depth information, etc. Detection ability, high signal-to-noise ratio, and the effect of improving signal-to-noise ratio

Active Publication Date: 2021-12-17
HARBIN INST OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Luminescence detection methods such as photoluminescence (PL) and electroluminescence (EL) can obtain intuitive solar cell images with high resolution, but these detection methods are integrated signals in the entire depth direction of the solar cell, while the luminescence signal The metal back contact layer cannot be penetrated, and the difference of the luminous signal of the front and rear surfaces cannot be obtained. Even if the position of the defect is displayed, the depth information of the defect cannot be obtained

Method used

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  • A system and method for accurate characterization of layered micro-defects in dark-field phase-locked thermal imaging of solar cells
  • A system and method for accurate characterization of layered micro-defects in dark-field phase-locked thermal imaging of solar cells
  • A system and method for accurate characterization of layered micro-defects in dark-field phase-locked thermal imaging of solar cells

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Experimental program
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specific Embodiment approach 1

[0066] Specific implementation mode one: as figure 1 As shown, the system for accurate characterization of solar cell layers provided by this embodiment consists of a suction hose 1, an exhaust hose 2, a vacuum pump 3, a water cooling pump 4, a water inlet hose 5, a drain hose 6, and a metal sample Table 7, Vacuum Adsorption Device 8, Water Cooling Heat Dissipation Plate 9, Silicon Solar Cell Sample 10, Sample Fixture 11, DC Power Supply Positive Output Line 12, DC Power Supply Negative Output Line 13, DC Power Supply 14, Solar Cell Defect Layer Accurate Characterization Software 15, computer 16, first signal transmission line 17, data acquisition card 18, second signal transmission line 19, third signal transmission line 20, fourth signal transmission line 21, infrared thermal imager 23, three-dimensional mobile platform, wherein:

[0067] Described three-dimensional moving platform is made of Y moving platform 22, Z moving platform 24 and X moving platform 25, Y moving platf...

specific Embodiment approach 2

[0079] Specific embodiment 2: This embodiment provides a layered and accurate characterization of micro-defects in solar cells using the system described in Specific Embodiment 1. The method measures the 0° images of the front and rear surfaces of the solar cell sample , -90° image, amplitude image and phase image, the corresponding images are subtracted to obtain the defect depth resolution result of the solar cell sample. The specific implementation steps are as follows:

[0080] Step (1): Determine the silicon solar cell sample 10 to be measured, place it on the metal sample stage 7, with the front grid facing up;

[0081] Step (2): Turn on the vacuum pump 3 and the water-cooled pump 4, place the sample fixture 11 at the gate of the silicon solar cell sample 10, fix the sample fixture 11 so that the two are in good contact, connect the positive output line 12 of the DC power supply with the The metal sample table 7 is connected, and the negative output line 13 of the DC powe...

specific Embodiment approach 3

[0089] Specific Embodiment 3: This embodiment provides a method for using the system described in Specific Embodiment 1 to carry out hierarchical and accurate characterization of solar cell defects. The method uses the point spread function PSF (Point Spread Function) to obtain 0°, -90°, amplitude and phase images are deconvoluted to obtain the real part and imaginary part images respectively. By changing the heat source depth z defined in the point spread function, until the deconvoluted imaginary part image is zero or reaches the minimum, this The heat source depth z in the point spread function at time is the actual depth of solar cell defects, and the depth position of the heat source can be distinguished. Specifically include the following steps:

[0090] Step (1): Determine the silicon solar cell sample 10 to be measured, place it on the metal sample stage 7, with the front grid facing up;

[0091] Step (2): Turn on the vacuum pump 3 and the water-cooled pump 4, place t...

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Abstract

The invention discloses a system and method for precise characterization of layered micro-defects in dark-field phase-locked thermal imaging of solar cells. plate, vacuum adsorption device, sample fixture, water-cooled pump, vacuum pump and DC power supply, wherein: the three-dimensional mobile platform is equipped with an infrared thermal imager and a water-cooled heat sink; the water-cooled heat sink is equipped with a metal sample table and a vacuum adsorption device; The water-cooled radiator plate is connected with the water-cooled pump; the vacuum adsorption device is connected with the vacuum pump; the sample fixture is set on the metal sample stage; the positive pole of the DC power supply is connected with the metal sample stage, and the negative pole is connected with the sample fixture; The computer is connected with the data acquisition card; the data acquisition card is respectively connected with the DC power supply and the computer. The invention can accurately characterize micro-defects, and is an intuitive, accurate and large-area detection method.

Description

technical field [0001] The invention belongs to the field of photovoltaic technology, and relates to a system and method for accurately characterizing layered micro-defects of solar cells based on the principle of dark-field phase-locked infrared thermal imaging. Background technique [0002] Solar cells are key devices for converting solar energy into electrical energy and are widely used. Due to the complexity of its production process, various defects will inevitably occur during the production process. Common defects include printing defects, edge defects, sintering defects, and hidden cracks in processing. These defects will lead to a decrease in the photoelectric conversion efficiency of the solar cell, thereby affecting its working efficiency, and in severe cases, waste chips may be generated, reducing the working life of the solar cell module and causing irreparable economic losses. Therefore, related solar cell imaging detection technologies emerged as the times re...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06T7/00G06T1/00
Inventor 刘俊岩徐宏图宋鹏吴思萱王扬
Owner HARBIN INST OF TECH
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