batch system disk SSD power-off test method based on a mainboard

A power-off test and system disk technology, applied in the detection of faulty computer hardware, etc., can solve the problems of inconvenient deployment, poor compatibility, and limitations, and achieve the effect of convenient deployment, simple control unit, and strong load capacity

Pending Publication Date: 2019-05-31
SHANDONG SINOCHIP SEMICON
View PDF7 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Existing test methods rely on WOL functions, are limited by the network or the motherboard, are inconvenient to deploy, and have poor compatibility

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • batch system disk SSD power-off test method based on a mainboard

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0016] This embodiment discloses a method for powering off a batch of system disk SSDs based on a motherboard, such as figure 1 As shown in the flow chart, before the test starts, the operating systems of multiple hosts using SSD storage devices as system disks are in a shutdown state. Preparations that need to be done also include:

[0017] 1. Prepare interfaces that can provide voltage signal sources on the main boards of multiple machines (the pins on the main board can be inserted, and the voltage signal needs to change significantly during the system operation phase and in the shutdown state, and the voltage peak value should not exceed 5V). The external interface is usually 3.3v or 5v, and the voltage of this interface needs to drop to 0v quickly after the motherboard is powered off. When the interface voltage is high, it means that the motherboard is working normally, and the SSD of the system under test is powered on normally. When the interface voltage is not pulled u...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a batch system disk SSD power-off test method based on a mainboard, which comprises the following steps: detecting the voltage change of a controlled host taking an SSD deviceas a main disk of an operating system, realizing the startup operation of the controlled host through a relay according to the voltage change condition, and realizing the shutdown operation of the controlled host through an upper computer. In the cyclic process of completing login and exit operations of a plurality of machine operation systems, power-on and power-off cyclic operations of the batchSSD storage devices are realized, and automatic execution of startup and shutdown operation application scene tests in the compatibility test of the batch SSD devices is realized. The method does notdepend on a WOL function, is not limited by a network or a mainboard, and is convenient to deploy and high in compatibility.

Description

technical field [0001] The invention relates to an SSD power-off test method, in particular to a motherboard-based batch system disk SSD power-off test method, belonging to the technical field of SSD storage device testing. Background technique [0002] In the compatibility test of SSD storage devices, there are application test scenarios in which SSD devices are used as the main disk of the operating system to start and shut down, and multiple rounds are required to ensure product quality. Existing test methods rely on WOL functions, are limited by the network or motherboard, are inconvenient to deploy, and have poor compatibility. Contents of the invention [0003] The technical problem to be solved by the present invention is to provide a batch system disk SSD power-off test method based on the motherboard, which does not depend on the WOL function, is not limited to the network or the motherboard, is convenient for deployment, and has strong compatibility. [0004] In...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22
Inventor 王璞刘正主李铁宗成强
Owner SHANDONG SINOCHIP SEMICON
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap