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Measuring device and system
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A measuring device and beam technology, applied in the direction of testing moving fluid/granular solids, etc., can solve the problems of subtle change collection and display, and inability to have high sensitivity
Pending Publication Date: 2019-06-11
INST OF HIGH SPEED AERODYNAMICS OF CHINA AERODYNAMICS RES & DEV CENT
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[0004] The purpose of this application is to provide a measuring device and system to solve the problem that in the prior art, the process of high sensitivity, subtle changes and sharp changes cannot be better collected and displayed at the same time
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no. 1 example
[0037] like figure 1 As shown, the present application provides a measuring device, which includes a first light source emitter 10, a second light source emitter 20, a first modulator 30, a second modulator 40, a first knife edge 50, a second knife edge 60, Camera 70 and video camera 80 .
[0038] The first light source transmitter 10 is used for generating a first light beam and sending the first light beam to the first modulator 30 .
[0039] The second light source transmitter 20 is configured to generate a second light beam and emit the second light beam to the first modulator 30 , the wavelength of the first light beam is different from the wavelength of the second light beam.
[0040] The first modulator 30 is used to combine the first light beam and the second light beam into a mixed light beam, and transmit the mixed light beam to the flow field test section.
[0041] The second modulator 40 is used to receive the mixed light beam after passing through the flow field...
no. 2 example
[0075] like Figure 6 As shown, the present application provides a measurement system, the system includes a controller 101 and the measurement device in any implementation mode in the first embodiment, the controller 101 is connected with the first light source emitter 10, the second light source emitter 20, The camera 70 and the camera 80 are connected,
[0076] The controller 101 is used to control the first light source emitter 10 , the second light source emitter 20 , the camera 70 and the video camera 80 to work synchronously.
[0077] Regarding the above solution, what needs to be explained here is that after the controller receives the high-level triggersignal, it simultaneously sends trigger signals to the camera 70, video camera 80, first light source emitter 10, and second light source emitter 20, so that they all start with Working at the same frequency, the light emitting time of the first light source emitter 10 and the second light source emitter 20 is 10 ns, ...
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Abstract
The invention provides a measuring device and system. The measuring device comprises a first light source emitter used for generating a first light beam and emitting the first light beam to a first modulator; a second light source emitter used for generating a second light beam and emitting the second light beam to the first modulator, wherein the wavelength of the first light beam is different from that of the second light beam; the first modulator used for mixing the first light beam with the second light beam to form a mixed light beam and transmitting the mixed light beam to a flow field test section; a second modulator used for receiving the mixed light beam after passing through the flow field test section, dispersing the mixed light beam into the first light beam and the second light beam so that the first light beam passes through a first knife edge to enter a camera and the second light beam passes through the second knife edge to enter a video camera; the camera used for forming a shadow image of the flow field test section; and a video camera used for forming a schlieren image of the flow field test section.
Description
technical field [0001] The present application relates to the technical field of measurement and imaging, and mainly relates to a measurement device and system. Background technique [0002] Both the schlieren method and the shadow method are important optical display methods in the field of fluid display. The schlieren method can display the inhomogeneity of the first derivative of the refractive index, and the shadow method can display the inhomogeneity of the second derivative of the refractive index. The method is suitable for shooting processes with high sensitivity and subtle changes, while the shadow meter is suitable for displaying rapid changes such as turbulence. [0003] However, there is currently no device capable of capturing and displaying processes with high sensitivity, subtle changes, and sharp changes at the same time. Contents of the invention [0004] The purpose of the present application is to provide a measuring device and system for solving the pr...
Claims
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Application Information
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IPC IPC(8): G01N21/85
Inventor 黄振新陈植李腾骥胥继斌路波吴军强吴勇航吴继飞
Owner INST OF HIGH SPEED AERODYNAMICS OF CHINA AERODYNAMICS RES & DEV CENT