Contact-type free-form surface structure product eccentricity measuring method

A technology of contact measurement and curved surface structure, applied in the direction of measuring devices, instruments, optical devices, etc., can solve the problems of eccentricity error, position error, tilt error, etc., and achieve the effect of small measurement error and simple steps

Inactive Publication Date: 2019-06-21
DONGGUAN HARMONY COOPERATION PLASTIC & HARDWARE TECH CO LTD
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

[0002] In recent years, in various optical systems used in digital cameras, video cameras, etc., aspheric lenses are often used to improve optical performance and miniaturize the optical system. In some cases, due to the eccentric component of the curved surface structure product, the position error when the curved surface structure product is held on the measuring device, the tilt error, etc., there is a large error in the actual measurement of the eccentricity of the curved surface structure product

Method used

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  • Contact-type free-form surface structure product eccentricity measuring method
  • Contact-type free-form surface structure product eccentricity measuring method
  • Contact-type free-form surface structure product eccentricity measuring method

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Embodiment Construction

[0018] The present invention will be described below in conjunction with specific embodiments.

[0019] Such as Figure 1-3 As shown, a contact method for measuring the eccentricity of a free-form surface structure product includes the following steps:

[0020] Step 1, the product is clamped and fixed, and the coordinate system is established according to the product assembly structure;

[0021] Step 2: Offset the zero point of the probe according to the design theoretical position and insert the needle, scan the contour of the S1 surface, and output the coordinates of the S1 surface point;

[0022] Step 3: Offset the zero point of the probe according to the design theoretical position and insert the needle, scan the contour of the S2 surface, and output the coordinates of the S2 surface point;

[0023] Step 4: Bring the actual point coordinates of the S1 and S2 surface contours into the software Mathcad to fit the contours constructed by the S1 and S2 surface design equatio...

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Abstract

The invention discloses a contact-type free-form surface structure product eccentricity measuring method. The method comprises the following steps: 1, a product is clamped and fixed well, and a coordinate system is established according to a product assembly structure; 2, the zero point of a probe is biased according to a design theoretical position, stitching is carried out, S1 surface contour scanning is carried out, and S1 surface point coordinates are outputted; 3, the zero point of the probe is biased according to a design theoretical position, stitching is carried out, S2 surface contourscanning is carried out, and S2 surface point coordinates are outputted; 4, the S1 and S2 surface contour actual point coordinates are brought into software Mathcad to be fit with a contour established by S1 and S2 surface design equations, actual center deviation coordinates are outputted, and the center deviation coordinate calculation equations are: deltax=|x2-x1| and deltay=|y2-y1|; and 5, the inter-surface eccentricity of the free-form surfaces is calculated according to the spatial coordinate position, wherein the eccentricity calculation equation is as described in the specifications.The method disclosed in the invention can measure the eccentricity of the free-form surface structure product, and has the advantages of simple steps and small measurement errors.

Description

technical field [0001] The invention relates to the technical field of methods for measuring eccentricity of curved surfaces, in particular to a method for contact-type measurement of eccentricity of products with free-form surface structures. Background technique [0002] In recent years, in various optical systems used in digital cameras, video cameras, etc., aspheric lenses are often used to improve optical performance and miniaturize the optical system. In some cases, due to the eccentric component of the curved surface structure product, the position error when the curved surface structure product is held on the measuring device, the tilt error, etc., there is a large error in the actual measurement of the eccentricity of the curved surface structure product. Contents of the invention [0003] The object of the present invention is to provide a contact method for measuring the eccentricity of a product with a free-form surface structure in view of the deficiencies in ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/00
Inventor 李飞鹏
Owner DONGGUAN HARMONY COOPERATION PLASTIC & HARDWARE TECH CO LTD
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