An intelligent lock production test method

Abstract

The invention discloses an intelligent lock production test method. The method comprises the following steps: S1, carrying out function test in an on-line test mode in a PCBA stage of an intelligent lock electric control board; S2, after the function test is carried out, carrying out an aging test in an offline test mode; And S3, carrying out performance test on the assembled intelligent lock in an offline test mode. The test efficiency is greatly improved; A more precise test can be realized by using special test software, so that the test coverage rate is improved, and the probability of finding defects is increased; The test standardization degree is very high, and the condition of test leakage or false test caused by negligence of testers or misoperation is greatly reduced; The operation is simple, and the requirement on the professionality of testers is reduced; The requirement for high efficiency of mass testing is met, and the requirement for test data refinement is also met; And a three-in-one electric control board test software scheme is adopted, so that the procedure of burning for multiple times is avoided, and the production cost is saved.

Description

technical field [0001] The invention belongs to the field of electronic testing equipment, and in particular relates to a production and testing method for an intelligent lock. Background technique [0002] Existing smart lock production testing mainly relies on manual testing or testing using the embedded software program of the lock itself. [0003] Among them, manual testing has the following disadvantages: [0004] a) Manual operation is inefficient and requires a lot of time and manpower; [0005] b) The error rate of manual operation is high, and it is easy to introduce missed detection and misjudgment of human operation; [0006] c) It is difficult to unify the test standards, and different testers may get different results when testing. [0007] There are the following disadvantages in the embedded software program testing of the smart lock itself: [0008] a) Adding a test module to the embedded software program of the smart lock will occupy the scarce hardware ...

AI Technical Summary

Problems solved by technology

[0009] b) Limited by the hardware resources of the electronic lock itself, the test results cannot be displayed intuitively;

[0010] c) It is difficult to save the test information, and it is difficult to collect and organize it for quality traceability and process improvement

Images