Method and device for fault detection of electrical equipment
A power equipment and fault detection technology, applied in the field of power systems, can solve problems such as temperature or temperature rise is not fixed, false alarms, etc.
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Embodiment 1
[0071] This embodiment provides a method for fault detection of switch cabinets, the execution subject is a device for fault detection of switch cabinets, the device can be integrated in a relay, can also be set in a computer, of course, can also be set separately, here No longer.
[0072] Such as figure 1 As shown, it is a method for fault detection of a switchgear according to this embodiment, the method includes:
[0073] Step 101, obtain the respective first temperature rises of a group of contact points with the same attribute on the three phases of a switch cabinet, and each group of contact points with the same attribute is each contact point corresponding to the same position in the switch cabinet.
[0074] Switch cabinets generally each have three phases, each of which has at least one identical position. The same position is, for example, the contact position between the moving contact and the static contact of the circuit breaker, the contact position between the ...
Embodiment 2
[0091] This embodiment makes further supplementary descriptions of the method for detecting a switchgear failure in the first embodiment.
[0092] Such as figure 2 As shown, is a schematic flow chart of the method for fault detection of a switchgear according to this embodiment. The method includes:
[0093] Step 201, obtain the respective first temperature rises of a group of contact points with the same attribute on the three phases of a switch cabinet, and each group of contact points with the same attribute is each contact point corresponding to the same position in the switch cabinet.
[0094] This step is consistent with step 101 and will not be repeated here.
[0095] Step 202, determine the one with the largest value from the first temperature rises as the target temperature rise.
[0096] In this embodiment, the largest among the three first temperature rises is taken as the target temperature rise. If one of the three contact points of a group of contact points ...
Embodiment 3
[0108] This embodiment further supplements the description of the method in the preceding embodiments. This embodiment mainly makes a further supplementary explanation on how to obtain the first temperature rise in the foregoing embodiments, that is, the foregoing first temperature rises are all based on the predicted temperature rise of the contact point.
[0109] In this embodiment, obtaining the first temperature rises of the three phases corresponding to the contact points of the same attribute of a switch cabinet in the foregoing embodiments includes:
[0110] a: Obtain the fifth temperature rise of a contact point of a switchgear at the beginning of an initial sampling period and the sixth temperature rise at the end, the contact point being the contact position of at least two parts of the switchgear;
[0111] b: Obtain the time constant of the first-order inertial system of a switchgear;
[0112] c: According to the fifth temperature rise, the sixth temperature rise a...
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