Single-chip microcomputer open-circuit and electric leakage tester

Abstract

The invention provides a single-chip microcomputer open-circuit and electric leakage tester and belongs to the field of integrated circuit package testing technologies. The single-chip microcomputer open-circuit and electric leakage tester comprises a power source unit, a main control unit, a DA conversion unit, a mode switching unit, a test unit and an AD conversion unit; the input end of the main control unit is connected with the power source unit; the output end of the main control unit is connected with the DA conversion unit; the input end of the mode switching unit is connected with theoutput end of the main control unit; the output end of the mode switching unit is connected with the input end of the DA conversion unit; the output end of the DA conversion unit is connected with the input end of the test unit; the output end of the test unit is connected with the input end of the AD conversion unit; and the output end of the AD conversion unit is connected with the input end ofthe main control unit. With the single-chip microcomputer open-circuit electric leakage tester has an open short-circuit test and electric leakage test function. With the single-chip microcomputer open-circuit and electric leakage tester adopted, an open short-circuit test and an electric leakage test can be completed quickly and efficiently, and thus, the rapid detection of possible electrical and physical defects in a package product can be achieved.

Description

technical field [0001] The invention relates to the technical field of integrated circuit packaging and testing, in particular to an open-short-circuit leakage tester based on a single-chip microcomputer. Background technique [0002] The open-short circuit test refers to the discharge or protection circuit (clamp circuit, generally composed of two diodes connected end to end, and connected to VDD and VSS respectively) for each chip pin to test whether the diode voltage drop of the pin is accurate . When testing, connect the VDD pin of the chip to 0 volts (or ground), and then supply a 100uA to 500uA current from the tester to the chip and from the chip to the tester to each chip pin respectively, and measure the bias voltage of the diode Whether it is within the specified range, and then judge the connection status of the chip pins. [0003] The leakage test is to connect the test pin to a 0.8V voltage source, the ground pin is grounded, and the other pins are suspended t...

AI Technical Summary

Problems solved by technology

[0004] However, at present, there are defects such as open-short circuit and leakage test that are necessary in the packaging and testing process of the integrated circuit industry, high detection costs, and the detection of open-short circuit and leakage current cannot be completed at the same time. Therefore, it is necessary to develop a fast, efficient, economical and applicable development The short-circuit leakage tester is very necessary, and it also fully caters to the actual needs of chip packaging and testing companies

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