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A three-dimensional measurement method for structured light of colored objects based on hue optimized grayscale

A three-dimensional measurement and structured light technology, applied in measurement devices, optical devices, instruments, etc., can solve problems such as reconstructing surface roughness, achieve good modulation and improve fringe quality.

Active Publication Date: 2021-02-09
SICHUAN UNIV
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Problems solved by technology

[0004] The invention provides a three-dimensional measurement method of structured light of colored objects based on hue optimized grayscale, aiming to solve the problem of rough reconstructed surface caused by color information in the traditional structured light measurement algorithm in the measurement of colored objects

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  • A three-dimensional measurement method for structured light of colored objects based on hue optimized grayscale
  • A three-dimensional measurement method for structured light of colored objects based on hue optimized grayscale
  • A three-dimensional measurement method for structured light of colored objects based on hue optimized grayscale

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Embodiment Construction

[0053] A typical embodiment of a three-dimensional measurement method for structured light of a colored object based on hue-optimized grayscale of the present invention will be described in detail below, and the present invention will be further described in detail. It is necessary to point out that the following examples are only used for further description of the present invention, and cannot be interpreted as limiting the protection scope of the present invention, and those skilled in the art make some non-essential improvements to the present invention according to the above-mentioned content of the present invention And adjustments still belong to the protection scope of the present invention.

[0054] Step 1: Calibrate the projector-camera system

[0055] Preferably, in this example, the method of Zhang Zhengyou and Zhang Song is used to calibrate the projector-camera system, and the internal parameter matrix K of the projector is obtained P , the distortion matrix O ...

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Abstract

The invention provides a color object structured light three-dimensional measurement method for gray scale optimization based on a hue. The color object structured light three-dimensional measurementmethod belongs to the field of structured light three-dimensional measurement. The color object structured light three-dimensional measurement method comprises seven steps of calibrating a projector-video camera system, acquiring deformed strips, dividing a hue region of an object, determining a stripe gray scale of a hued region, positioning a hue-free region with poor stripe quality, updating astripe gray scale of the hue-free region and reconstructing a three-dimensional surface shape of the object. The color object structured light three-dimensional measurement method divides the surfaceof the object into a hued region and a hue-free region according to a hue principle, and adopts different stripe quality optimization methods for different regions; for the hued region, the gray scalevalue of an optimal modulation degree channel in R, G and B channels is taken as a synthesized stripe gray scale value; for the hue-free region with poor stripe quality, the gray scale value of the region is regained by changing the illumination intensity of a projector, so as to obtain a synthesized stripe pattern with stripe quality satisfying requirements finally; and the synthesized stripe pattern is utilized to complete low-noise reconstruction of the color object.

Description

technical field [0001] The invention relates to the field of three-dimensional measurement of structured light, in particular to a method for three-dimensional measurement of structured light of colored objects based on hue-optimized grayscale. Background technique [0002] Structured light three-dimensional measurement is one of the important methods in the field of three-dimensional measurement. It uses a projector to project the structural pattern generated by computer code onto the surface of the object, and then uses the camera to collect the projected pattern loaded with the shape information of the object. Finally, according to the collected The image reconstructs the three-dimensional shape of the object. Phase measurement profilometry, as a main structured light three-dimensional measurement method, is widely used in the fields of computer vision, medical diagnosis, industrial inspection and surface modeling. The projected pattern required for this method is a comp...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/25
CPCG01B11/25G01B11/2509
Inventor 冯国英袁寒李洪儒崔磊包忠毅
Owner SICHUAN UNIV
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