A DI machine projection control system and method for compensating exposure position
A technology of exposure position and control system, which is applied to the exposure device of photolithography process, microlithography exposure equipment, photolithography process of pattern surface, etc. Accurate, high-quality exposure effects
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[0040] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the drawings in the embodiments of the present invention.
[0041] See figure 1 , a DI machine projection control system is characterized in that it includes a main control system 1 and is electronically connected to the main control system 1:
[0042] The exposure carrier platform 2 is used to place the dry film. After the exposure process is started, under the control of the platform controller, it moves precisely in the direction of the X and Y axes of the plane;
[0043] Platform controller 3, used to control the in-plane displacement of the exposure carrier platform;
[0044] The projection system 4 includes several DMD projection subsystems, which are used to project the exposure pattern onto the dry film placed on the exposure carrier platform. The DMD projection subsystem includes a DMD control circuit, laser components, and o...
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