Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Low frequency oscillation analysis method based on sure wavelet denoising and improved hht

A low-frequency oscillation and wavelet denoising technology, applied in the direction of reducing/preventing power oscillation, etc., to achieve the effects of suppressing false component phenomena, accurate identification, and suppressing modal aliasing

Active Publication Date: 2022-04-12
FUZHOU UNIV
View PDF8 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] In view of this, the object of the present invention is to provide a low-frequency oscillation analysis method based on SURE wavelet denoising and improved HHT to solve the problem of accurate identification of low-frequency oscillation signals under the influence of noise in the power system wide-area measurement system, and to ensure that the power grid adopts reasonable Effective suppression measures to improve the stable operation of the power grid

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Low frequency oscillation analysis method based on sure wavelet denoising and improved hht
  • Low frequency oscillation analysis method based on sure wavelet denoising and improved hht
  • Low frequency oscillation analysis method based on sure wavelet denoising and improved hht

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0058] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0059] Please refer to figure 1 , the present invention provides the process based on SURE wavelet denoising and the low-frequency oscillation analysis method of improving HHT, it is characterized in that comprising the following steps:

[0060] Step S1: extracting the WAMS low-frequency oscillation signal.

[0061] Step S2: Perform SURE wavelet denoising preprocessing on the low-frequency oscillation signal. In this embodiment, the test signal x(n)=x is adopted 1 (n)+x 2 (n)+x 3 (n) is analyzed, where The number of sampling points is N=1000, and the sampling interval is T s = 0.01. Set the signal y(n)=x(n)+w(n), where y(n) is the low-frequency oscillation WAMS measurement signal, x(n) is the low-frequency oscillation signal, and w(n) is the noise signal. After SURE wavelet denoising preprocessing, in is the signal of y(n) preprocessed ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to the technical problem of low-frequency oscillation mode identification in a wide-area measurement system, and proposes a low-frequency oscillation analysis method based on SURE wavelet denoising and improved HHT. First, the SURE wavelet denoising is used to preprocess the oscillation signal, and then the improved HHT method is adopted. Perform modal identification. First of all, for the low-frequency oscillation signal measured by the power grid with strong noise, SURE wavelet denoising is used to realize signal preprocessing; secondly, CEEMD is performed on the preprocessed low-frequency oscillation signal, and the permutation entropy method is used to screen each IMF component to improve the empirical model. state decomposition, thereby improving the HHT analysis of low-frequency oscillations. The invention effectively suppresses the mode mixing and false component phenomena in the empirical mode decomposition, does not need order determination, and has accurate identification, and has good application value in the identification of low-frequency oscillations in electric power systems.

Description

technical field [0001] The invention relates to the technical field of grid stability analysis of a power system wide-area measurement system, in particular to a low-frequency oscillation analysis method based on SURE wavelet denoising and improved HHT. Background technique [0002] The scale of modern power grids is getting larger and larger, and the transmission network presents the characteristics of cross-regional, long-distance, and large-region interconnection. It is important to identify the low-frequency oscillation mode of the power system, and then warn and suppress the oscillation of the power system to ensure the safe and stable operation of the power system. significance. [0003] Wide Area Measurement Systems (WAMS) use Phase Measurement Units (PMU) as the low-level measurement unit, which can directly measure generator power angle, angular velocity, bus voltage, etc., which are closely related to the electromechanical transient process of generators The physi...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H02J3/24
CPCH02J3/24H02J2203/20
Inventor 金涛陈坚沈学宇张可
Owner FUZHOU UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com