High sensitivity optical time delay estimation system, method and medium

Abstract

The invention provides a high sensitivity optical time delay estimation system, method and medium. The high sensitivity optical time delay estimation system includes a light source module, a polarization state premodulation module, an optical time delay sensing module, a joint spectrum detection module, and a data processing module; the light source module is used for generating an original optical signal, and the central wavelength of the light source module is denoted as lambda 0; the polarization premodulation module block is used for premodulation of polarization of the original optical signal, and first output light is generated; the optical time delay sensing module is used for loading an optical delay value to be measured into the first output light, and second output light is generated; a post-polarization state selection module is used for projecting and decomposing the second output light according to a specified polarization state, and two ways of output light are generated,that is the third output light and the fourth output light. The high sensitivity optical time delay estimation system, method and medium adopt a method of 'combined bias weak value amplification', extremely sensitive measurements of small amounts such as time delays are realized, and a high sensitivity measurement scheme is also provided for other optical parameter estimation tasks.

Description

technical field [0001] The present invention relates to the measurement technology for tiny physical quantities, in particular to a high-sensitivity optical time delay estimation system, method and medium. In particular, it involves an optical time delay estimation system based on joint weak value amplification technology, which can be applied to realize optical precision measurement, such as optical coherence tomography, etc., to improve resolution and detection sensitivity. Background technique [0002] In the field of precision measurement, weak measurement techniques are mainly divided into two categories: weak value amplification weak measurement and combined weak measurement. Among them, the weak value amplification weak measurement technology was proposed earlier, and this technology has been widely used. But inevitably, this technology also has some defects, such as: [0003] 1. Weak value amplification Weak measurement uses weak coupling and post-selection technol...

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Problems solved by technology

[0004] 2. In weak value amplification and weak measurement, the calculation of magnification depends on the post-selection angle. Although the post-selection angle can be known in advance, in the experiment, once the post-selection polarizer is disturbed, the post-selection angle will deviate from the true value , then the measurement accuracy will be biased

[0007] 2) It is impossible to obtain a higher weak value amplification factor by modulating the bias phase

The present invention proposes a new method for estimating weak measurement parameters, which can organically combine the advantages of the weak value amplification and combined weak measurement schemes, learn from each other, and can not only overcome the low efficiency of the weak value amplification scheme, but also solve the problem of Combined with the problem that the magnification of the weak measurement scheme is difficult to improve, it provides a reliable technical approach for the use of high-efficiency and high-sensitivity parameter measurement

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