Crack near-field deformation analysis area determination method based on level set method
A technology for analyzing and determining areas, applied in image analysis, image data processing, complex mathematical operations, etc., can solve problems affecting analysis efficiency and large labor costs
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0035] The invention is a method for determining the crack near-field deformation analysis area based on the level set method. By defining the level set function for the crack trajectory and calculating the level set function value, the relationship between the function value and the non-analysis area is set, so as to complete the analysis of the crack Updates to the near-field deformation analysis area.
[0036] Concrete process steps of the present invention are:
[0037] Step 1: Set the initial crack near-field analysis area; specifically: according to the geometric shape or size of the cracked specimen and the crack shape, such as figure 2 As shown in , the initial analysis area of the near field of the crack is set to ensure that the initial analysis area includes the effective analysis area of the specimen and does not include the crack disconnection area. Since the pixel information generated by the crack disconnection area will affect the analysis of the crack ne...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com