A method for measuring baseline vector of dual-antenna insar system

A measurement method and dual-antenna technology, which are applied in radio wave measurement systems, measurement instruments, measurement devices, etc., can solve the problems of high baseline vector accuracy, low precision and high cost, and achieve the effect of simple implementation method, few steps, and reduced measurement time.

Active Publication Date: 2021-04-20
XIAN UNIV OF SCI & TECH
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Problems solved by technology

[0006] The purpose of the present invention is to provide a method for measuring the baseline vector of a dual-antenna InSAR system to solve the problems of low accuracy and high cost of high baseline vector measurement in the prior art

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  • A method for measuring baseline vector of dual-antenna insar system
  • A method for measuring baseline vector of dual-antenna insar system
  • A method for measuring baseline vector of dual-antenna insar system

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Embodiment Construction

[0050] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0051] A method for measuring the baseline vector of a dual-antenna InSAR system of the present invention includes: an aircraft loaded with a dual-antenna InSAR system, several measuring points are set up on the surrounding aircraft, and several points to be measured are set on the aircraft.

[0052] Use the total station at each station to measure the three-dimensional positions of the points to be measured that can be observed in the field of view of the total station, and obtain several three-dimensional coordinates; unify several three-dimensional coordinates to the total station according to the principle of edge angle network In the coordinate system, the three-dimensional position of each point to be measured in the total station coordinate system is obtained; the three-dimensional position is fitted to the origin of the coordinate syst...

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Abstract

The invention discloses a method for measuring a baseline vector of a dual-antenna InSAR system, which solves the problems of low precision and high cost of high baseline vector measurement in the prior art. The method comprises: an aircraft loaded with a dual-antenna InSAR system; several observation points are set up on the surrounding aircraft, and several points to be measured are set on the aircraft; Measure the three-dimensional position of the measuring point to obtain several three-dimensional coordinates; unify several three-dimensional coordinates into the coordinate system of the total station according to the principle of edge angle network, and obtain the three-dimensional position of each point to be measured in the coordinate system of the total station; by The three-dimensional position fits the origin of the coordinate system of the IMU coordinate system and the directions of the three coordinate axes, and then obtains the conversion relationship from the total station coordinate system to the IMU coordinate system; two The phase center of the InSAR antenna, from which the baseline vector of the dual-antenna InSAR system is calculated.

Description

technical field [0001] The invention relates to the technical field of radar in the electronics industry, in particular to a method for measuring a baseline vector of a dual-antenna InSAR system. Background technique [0002] Interferometric Synthetic Aperture Radar (InSAR for short) is a radar active imaging remote sensing measurement technology developed on the basis of synthetic aperture radar technology. It is the product of the combination of synthetic aperture radar technology, differential GPS and inertial measurement technology. The InSAR system has the advantages of all-day, all-weather, wide measurement range, high measurement accuracy, and easy implementation. It can obtain a wavelength-level high-precision digital elevation model (Digital Elevation Mode, referred to as DEM), and can also detect the earth's land surface, sea surface, etc. And the tiny deformation of the ice and snow surface, to obtain the surface change information with millimeter precision, has a...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01S7/40G01C15/00G01C21/16
CPCG01C15/00G01C21/16G01S7/4026
Inventor 王静龚文熔夏猛庞立华刘久利蔡娅雯唐文豪李莹
Owner XIAN UNIV OF SCI & TECH
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