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Method for detecting the focal length of any wavelength in a transmissive optical system

An optical system, transmissive technology, applied in the direction of testing optical performance, optical instrument testing, measuring devices, etc.

Active Publication Date: 2020-11-03
苏州维纳仪器有限责任公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Therefore, due to the limitations of current measuring instruments and methods, only limited wavelength focal lengths can be measured

Method used

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  • Method for detecting the focal length of any wavelength in a transmissive optical system
  • Method for detecting the focal length of any wavelength in a transmissive optical system
  • Method for detecting the focal length of any wavelength in a transmissive optical system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0046] figure 1 It is a schematic diagram of the focal length and the back focus of the lens. The difference between the focal length and the back focus lies in the difference in the reference plane, so the change of the focal length and the back focus with the wavelength is the same.

[0047] This embodiment is for detecting the focal length of any wavelength in a single-wavelength optical system.

[0048] figure 2 It is a schematic diagram of using a focal length meter to measure the focal length of the optical system in the present invention; image 3 is a schematic diagram of the detection device for detecting the back intercept of the optical system in the present invention.

[0049] Such as figure 2 , 3As shown, the detection optical system focal length device 100 includes a focal length meter 10 and an optical system 11 to be tested. The detection optical system back intercept device 200 comprises a laser 20, a negative lens 21, a microscopic objective lens 22, a...

Embodiment 2

[0064] This embodiment is for detecting the focal length of any wavelength in a single-wavelength optical system.

[0065] Figure 5 is a schematic diagram of the back intercept of the interferometer detection optical system used in the present invention.

[0066] Such as figure 2 , 5 As shown, the detection optical system focal length device 100 includes a focal length meter 10 and an optical system 11 to be tested. The detection optical system back intercept device 400 includes a 4-wavelength laser interferometer 40, a standard flat mirror 41, an optical system to be tested 11 (in this embodiment, the optical system to be tested is a single-wavelength optical system) and a spherical reflector 43. The back intercept device 400 of the detection optical system is replaced with a different laser interferometer to detect back intercepts of different wavelengths.

[0067] Use the focal length meter 10 to measure the focal length of the optical system 11 to be tested (conventi...

Embodiment 3

[0081] This embodiment is for detecting the focal length of any wavelength in the achromatic optical system.

[0082] Figure 4 It is a schematic diagram of using an interferometer to measure the focal length of the optical system in the present invention.

[0083] Such as image 3 , 4 As shown, the transmitted wavefront detection device 300 for detecting any wavelength optical system includes a laser interferometer 30, a standard spherical mirror 31, an optical system to be tested 11 (the type of the optical system to be tested in this embodiment is an achromatic optical system), a flat plate Glass 33 and reflective flat mirror 34. The detection process is detailed in patent CN201410439298.6), and the focal length of the optical system 11 to be tested at one wavelength is obtained. Then use the back intercept detection device 200 to measure the back intercepts of the four wavelengths of the optical system. In the back intercept detection device, the beam emitted by the l...

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Abstract

The invention provides a method for detecting the focal length of any wavelength of a transmission type optical system. The method is characterized by comprising the following steps: 1, measuring thefocal length of the optical system to obtain the focal length f (lambda 0) of the optical system with the wavelength lambda 0; 2, measuring the back focal lengths of the optical system to obtain the back focal lengths l (lambda 1), l (lambda 2) ...... l (lambda m) of the optical system with the wavelengths lambda 1-lambda m; 3, substituting l (lambda 1), l (lambda 2) ...... l (lambda m) into an equation of the back focal lengths and the wavelengths, and calculating the values of Al, Bl, Cl and Dl; 4, substituting the calculated values of Al, Bl, Cl and Dl into an equation of the focal lengthsand the wavelengths, and calculating the back focal lengths l (lambda 0) and l (lambda n) of the optical system with the wavelengths lambda 0 and lambda n; 5, calculating an interval of the back focallengths through l (lambda 0) and l (lambda n); and 6, through f (lambda 0), calculating the focal length f (lambda n), wherein the optical system is any one of a single-wavelength system, an achromatic system and an apochromatic system.

Description

technical field [0001] The invention relates to a method for detecting the focal length, in particular to a method for detecting the focal length of any wavelength of a transmissive optical system. Background technique [0002] The focal length is an important parameter of the optical system. Commonly used focal length measurement methods include the magnification method, the precision goniometric method, and the Abbe focal length meter method. Optical systems are usually designed at a specific wavelength and within a certain range of wavelengths. The focal length of a transmissive optical system changes with the wavelength, and in many applications it is necessary to know the focal length of the system accurately. [0003] In the existing method of measuring the focal length, the focal length of a certain wavelength or a very narrow bandwidth band is mainly measured. For example, the commonly used focal length meter uses a narrow bandwidth LED light source centered at 550n...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01M11/02
CPCG01M11/0242G01M11/0271
Inventor 韩森张齐元庄锦程王全召李雪园
Owner 苏州维纳仪器有限责任公司