Method and device for controlling rise time of module testing power supply

Abstract

The invention relates to the technical field of a display module, in particular to a method and a device for controlling the rise time of a module testing power supply. Based on the multi-channel independent control of an editable gate array, the control process comprises the steps of after receiving a power-on command, triggering a timer of each channel for timing; and when any channel reaches the timing interval corresponding to the timer of the channel, sending a timing interruption corresponding to the channel number of the channel; receiving the timing interruption and sending a steppingvoltage value to the channel corresponding to the timing interrupt; and accumulating the stepping voltage value received by each channel each time, and outputting the accumulated voltage values. Taskscheduling is performed by use of a CPU (Central Processing Unit) embedded in an FPGA (Field Programmable Gate Array), and the high-speed parallel power-on time and waveform control are implemented through the multi-channel independent hardware control logic.

Description

technical field [0001] The invention relates to the technical field of display modules, in particular to a method and a device for controlling the rise time of a module test power supply. Background technique [0002] When display module manufacturers conduct power-on point-screen tests on LCM, OLED and other display modules, the module IC has strict requirements on the rise time of the test power supply, otherwise the module may work abnormally or even be damaged. [0003] Usually, the method of testing the rising time of the power supply with a single-chip microcomputer control module is slow, the waveform is poor, and the time accuracy is low. Moreover, due to the seriality of its execution instructions, it is impossible to guarantee the real-time performance of multiple channels of the test module to test the power supply. Responsiveness, precision and parallelism. Contents of the invention [0004] In order to solve the above-mentioned technical problems, the object ...

AI Technical Summary

Problems solved by technology

[0002] When display module manufacturers conduct power-on point-screen tests on LCM, OLED and other display modules, the module IC has strict requirements on the rise time of the test power supply, otherwise the module may work abnormally or even be damaged

[0003] Usually, the method of testing the rising time of the power supply with a single-chip microcomputer control module is slow, the waveform is poor, and the time accuracy is low. Moreover, due to the seriality of its execution instructions, it is impossible to guarantee the real-time performance of multiple channels of the test module to test the power supply. Responsiveness, precision and parallelism

Images