Chromatic dispersion type AFS light source scattering interference deduction method based on DMD

Abstract

The invention belongs to the technical field of spectral analysis, and particularly relates to a chromatic dispersion type AFS light source scattering interference deduction method based on a DMD. Themethod comprises the steps of determining a light source characteristic spectral line of an excitable relatively strong non-resonance fluorescence line of a to-be-measured element; selecting a narrow-band pass filter corresponding to the central wavelength according to the determined light source characteristic spectral line, placing the narrow-band pass filter in front of an atomizer to ensure that only the wavelength in a band-pass range of the narrow-band filter in an excitation light source can penetrate through the filter, and generating corresponding resonance fluorescence and non-resonance fluorescence through the atomizer; controlling a digital micromirror to perform full spectrum measurement, and confirming a range of corresponding pixels of non-resonance fluorescence line information which participates in detection on the digital micromirror; and measuring all non-resonance fluorescence intensities according to the range, and performing summation to obtain a fluorescence intensity value of the to-be-measured element. According to the method, the scattering interference of the light source can be effectively avoided, so that the accuracy of a quantitative detection resultof the to-be-measured element is improved.

Description

technical field [0001] The invention belongs to the technical field of spectrum analysis, and in particular relates to a DMD-based method for subtracting scattering interference of a dispersion-type AFS light source. Background technique [0002] When the atomic fluorescence spectrometer detects the analyte in the sample, due to the efficiency of the gas-liquid separator, there will be some incompletely vaporized aerosol particles and water vapor particles in the atomizer. Under normal circumstances, the excitation light source only excites the free atoms in the atomizer to generate fluorescence signals for detection, but due to the existence of aerosol particles and water vapor particles, the excitation light source will directly enter the detection system through scattering, which is confused with the generated fluorescence signals. This type of interference is called the light source scattering interference of the atomic fluorescence spectrometer; at the same time, since ...

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Problems solved by technology

[0003] In the prior art, the deduction of light source scattering interference is mostly carried out by calculating the interference coefficient method. This method requires multiple measurements and the calculation of the interference coefficient is relatively cumbersome.

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