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Chromatic dispersion type AFS light source scattering interference deduction method based on DMD

A technology of scattering interference and light source, applied in the field of spectral analysis, can solve problems such as cumbersome process, achieve the effect of improving measurement intensity, simplifying measurement, and quickly deducting scattering

Active Publication Date: 2019-11-15
JILIN UNIV
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Problems solved by technology

[0003] In the prior art, the deduction of light source scattering interference is mostly carried out by calculating the interference coefficient method. This method requires multiple measurements and the calculation of the interference coefficient is relatively cumbersome.

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  • Chromatic dispersion type AFS light source scattering interference deduction method based on DMD
  • Chromatic dispersion type AFS light source scattering interference deduction method based on DMD
  • Chromatic dispersion type AFS light source scattering interference deduction method based on DMD

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Embodiment Construction

[0019] In order to make the object, technical solution and advantages of the present invention more clear, the present invention will be further described in detail below in conjunction with the examples. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0020] A kind of dispersion type AFS (atomic fluorescence spectrometer, atomic fluorescence spectrometer) light source scattering interference deduction method step based on DMD (Digital Micro-mirror Device, digital micromirror) of the present invention is as follows: see figure 2 and image 3 Shown:

[0021] Step 1. Determine the characteristic spectral line of the light source that the element to be measured can excite a strong non-resonant fluorescent line. This method adopts a narrow bandpass filter, because the existing narrow bandpass filter can only pass through the wavelength in the bandpass range, wherein the ce...

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Abstract

The invention belongs to the technical field of spectral analysis, and particularly relates to a chromatic dispersion type AFS light source scattering interference deduction method based on a DMD. Themethod comprises the steps of determining a light source characteristic spectral line of an excitable relatively strong non-resonance fluorescence line of a to-be-measured element; selecting a narrow-band pass filter corresponding to the central wavelength according to the determined light source characteristic spectral line, placing the narrow-band pass filter in front of an atomizer to ensure that only the wavelength in a band-pass range of the narrow-band filter in an excitation light source can penetrate through the filter, and generating corresponding resonance fluorescence and non-resonance fluorescence through the atomizer; controlling a digital micromirror to perform full spectrum measurement, and confirming a range of corresponding pixels of non-resonance fluorescence line information which participates in detection on the digital micromirror; and measuring all non-resonance fluorescence intensities according to the range, and performing summation to obtain a fluorescence intensity value of the to-be-measured element. According to the method, the scattering interference of the light source can be effectively avoided, so that the accuracy of a quantitative detection resultof the to-be-measured element is improved.

Description

technical field [0001] The invention belongs to the technical field of spectrum analysis, and in particular relates to a DMD-based method for subtracting scattering interference of a dispersion-type AFS light source. Background technique [0002] When the atomic fluorescence spectrometer detects the analyte in the sample, due to the efficiency of the gas-liquid separator, there will be some incompletely vaporized aerosol particles and water vapor particles in the atomizer. Under normal circumstances, the excitation light source only excites the free atoms in the atomizer to generate fluorescence signals for detection, but due to the existence of aerosol particles and water vapor particles, the excitation light source will directly enter the detection system through scattering, which is confused with the generated fluorescence signals. This type of interference is called the light source scattering interference of the atomic fluorescence spectrometer; at the same time, since ...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/64
CPCG01N21/6404G01N2021/6417
Inventor 田地王宏霞刘可李春生
Owner JILIN UNIV
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