Chip processing device integrating testing function with sorting function

Abstract

The invention discloses a chip processing device integrating a testing function with a sorting function, comprising a worktable, wherein the worktable is of a box-type structure, a control box is arranged in the worktable, a liquid crystal display screen and an audible and visual alarm are arranged on one side of a tabletop of the worktable, a test box is arranged on a fixing frame at the middle position of the table top of the worktable, rectangular passages for enabling a storage plate to pass through are formed on left and right sides of the test box, four completely identical chip placement discs are arranged on the storage plate, to-be-detected chips are placed on the chip placement discs, when the storage plate is transferred into the test box, the position of a cross test board is adjusted according to the positions of the chips on the storage plate, so that a detection probe on each corner of the cross test board detect the chips, accordingly, the simultaneous detection of fourchips in one test is realized, improving the test efficiency of the chips, and the working intensity of detection personnel is reduced by the automatic detection of the detection probe.

Description

technical field [0001] The invention belongs to the technical field of electronic components; in particular, it relates to a chip processing device integrating testing and sorting functions. Background technique [0002] IC chip is an integrated circuit formed by a large number of microelectronic components placed on a plastic base to make a chip. The integrated circuit chip must be strictly tested before leaving the factory. The test items include various performance parameters of the integrated circuit chip, such as Current and voltage, etc., people need to screen out the integrated circuit chips whose test results are not within the qualified range, and classify the integrated circuit chips with different test results. [0003] The test of the electrical performance of the chip needs to connect the IC chip to the test system. After the test is completed, the IC chip needs to be classified according to the performance of the test. In the prior art, the receiving mechanism ...

AI Technical Summary

Problems solved by technology

[0004] 1. The existing chip test speed is slow, and the chips are tested one by one by hand-held test probes, which not only requires a lot of work for the testers, but also reduces the efficiency of chip testing;

[0005] 2. The existing chip testing device has a low degree of automation and needs to manually judge the test results of the chip, which is not conducive to the large-scale production of enterprises;

[0006] 3. The position of the existing chip testing device is relatively fixed, usually only one type of chip can be tested, which is not conducive to testing a variety of different types of chips, and the practicability is poor

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