Grain quality index prediction method based on SVM support vector machine model
A technology of support vector machine and prediction method, which is applied in the direction of prediction, computer parts, character and pattern recognition, etc., and can solve the problems of wasting manpower and material resources and reducing efficiency
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0042] Such as figure 1 As shown, the present embodiment provides a grain quality index prediction method based on the SVM support vector machine model, including:
[0043] S1: Select a part of grain in period t as sample grain;
[0044] S2: Measure the quality index data and quality index data of the sample grain as sample data {(x i,t ,y i,t )|i=1, 2,..., k}, where, x i is the quality index data, y i,t for and x i,t The corresponding quality index data, k is the amount of sample data;
[0045] S3: constructing an SVM support vector machine model according to the sample data;
[0046] S4: Measure the quality index data of the grain in period t, and predict the quality index of grain in period t according to the constructed SVM support vector machine model.
[0047] In this embodiment, the grain can be corn, wheat, japonica rice, indica rice, etc., and the index of grain includes quality index and quality index, wherein, the quality index of corn is the fatty acid value...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com