Hardware-in-the-loop test method and test system suitable for automatic terminal

Abstract

The invention discloses a hardware-in-loop test method and test system suitable for an automatic terminal. The power distribution network simulation model is built in the digital simulator, the faultworking condition is preset, a large number of simulation fault test quantities can be provided for tests under the condition that real power grid faults do not occur, and the built power distributionnetwork simulation model has fault characteristics of a real power distribution network; a digital simulator transmits simulated analog fault test quantity to the ATU to be tested on site, and the ATU to be tested transmits switch action signals back to the digital simulator, so that closed-loop test is realized, and dynamic control characteristics of the automatic terminal are truly reflected. According to the test method, all ATUs participating in the test are connected in the same local area network through the switch, communication layer intercommunication is achieved, interconnection andintercommunication tests can be achieved on ATUs produced by different manufacturers, the test method is not limited by the space where the ATUs are located any more, and mining and analysis of ATU cooperation problems are greatly facilitated.

Description

technical field [0001] The invention belongs to the field of power system testing, and in particular relates to a hardware-in-the-loop testing method and testing system suitable for automation terminals. Background technique [0002] In recent years, with the promotion of intelligent distributed distribution network automation, the requirements for testing automation terminals (ATU) have also gradually changed. The current testing work is mainly carried out in the factory building or on site, using relay protection testers based on open-loop testing for The ATU applies different simulated fault signals to test whether its function is normal. The defect of such a test method is mainly that the open-loop test cannot feed back the logical judgment results of the ATU to the power grid and cannot test the dynamic control characteristics of the ATU, and cannot achieve closed-loop, which is poor in systematization; in addition, it is necessary to perform a power-off test on the equ...

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Problems solved by technology

The defect of such a test method is mainly that the open-loop test cannot feed back the logical judgment results of the ATU to the power grid and cannot test the dynamic control characteristics of the ATU, and cannot achieve closed-loop, which is poor in systematization; in addition, it is necessary to perform a power-off test on the equipment in specific cases , significantly reducing power supply reliability and stability

[0003] In addition, most of the current test tools are based on the fact that the ATUs participating in the test come from the same manufacturer. However, the ATUs used in reality are often from different manufacturers. The existing test tools cannot realize the interconnection test between ATUs from different manufacturers. greater limitations

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