Hardware-in-the-loop test method and test system suitable for automatic terminal

An automated terminal and test method technology, applied in automated test systems, test/monitoring control systems, general control systems, etc., can solve problems such as reducing the reliability and stability of power supply, unable to achieve closed-loop, unable to test ATU dynamic control characteristics, etc. , to facilitate excavation and analysis, improve the convenience of testing, and reduce the workload of maintenance and debugging

Inactive Publication Date: 2019-12-10
GUANGDONG ELECTRIC POWER SCI RES INST ENERGY TECH CO LTD
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Problems solved by technology

The defect of such a test method is mainly that the open-loop test cannot feed back the logical judgment results of the ATU to the power grid and cannot test the dynamic control characteristics of the ATU, and cannot achieve closed-loop, which is poor in systematization; in addition, it is necessary to perform a power-off test on the equipment in specific cases , significantly reduci

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  • Hardware-in-the-loop test method and test system suitable for automatic terminal
  • Hardware-in-the-loop test method and test system suitable for automatic terminal
  • Hardware-in-the-loop test method and test system suitable for automatic terminal

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[0041] The technical solutions of the present application will be clearly and completely described below in conjunction with the accompanying drawings. Apparently, the described embodiments are some of the embodiments of the present application, not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of this application.

[0042] see Figure 1 to Figure 2 , the present embodiment provides a hardware-in-the-loop test method and test system for an intelligent distributed automation terminal, including: a real-time digital simulator 100, a total I / O interface module 110 including an analog output I / O interface module 111 and a digital output Input I / O interface module 112, real-time power amplifier 120, analog circuit breaker 130, GOOSE network switch 140, 8 automatic terminals ATU1-ATU8 to be tested.

[0043] In this embodiment, the ana...

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Abstract

The invention discloses a hardware-in-loop test method and test system suitable for an automatic terminal. The power distribution network simulation model is built in the digital simulator, the faultworking condition is preset, a large number of simulation fault test quantities can be provided for tests under the condition that real power grid faults do not occur, and the built power distributionnetwork simulation model has fault characteristics of a real power distribution network; a digital simulator transmits simulated analog fault test quantity to the ATU to be tested on site, and the ATU to be tested transmits switch action signals back to the digital simulator, so that closed-loop test is realized, and dynamic control characteristics of the automatic terminal are truly reflected. According to the test method, all ATUs participating in the test are connected in the same local area network through the switch, communication layer intercommunication is achieved, interconnection andintercommunication tests can be achieved on ATUs produced by different manufacturers, the test method is not limited by the space where the ATUs are located any more, and mining and analysis of ATU cooperation problems are greatly facilitated.

Description

technical field [0001] The invention belongs to the field of power system testing, and in particular relates to a hardware-in-the-loop testing method and testing system suitable for automation terminals. Background technique [0002] In recent years, with the promotion of intelligent distributed distribution network automation, the requirements for testing automation terminals (ATU) have also gradually changed. The current testing work is mainly carried out in the factory building or on site, using relay protection testers based on open-loop testing for The ATU applies different simulated fault signals to test whether its function is normal. The defect of such a test method is mainly that the open-loop test cannot feed back the logical judgment results of the ATU to the power grid and cannot test the dynamic control characteristics of the ATU, and cannot achieve closed-loop, which is poor in systematization; in addition, it is necessary to perform a power-off test on the equ...

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Application Information

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IPC IPC(8): G01R31/28G05B23/02
CPCG01R31/2834G05B23/0213
Inventor 韩博文宋旭东陈小军顾博川侯艾君高雅
Owner GUANGDONG ELECTRIC POWER SCI RES INST ENERGY TECH CO LTD
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