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Image acquisition device for flaw detection and flaw detection system

An image acquisition device and defect detection technology, which is applied in the direction of measuring devices, optical testing of defects/defects, and material analysis through optical means, can solve the problem that the optimization effect does not meet the needs of defect detection, detection, etc., to avoid overexposure, The effect of improving accuracy and facilitating analysis

Pending Publication Date: 2019-12-20
钟国韵
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In the prior art, the surface of the product is often photographed from the front of the camera device, but for products with a smooth surface and a certain texture on the surface, it is difficult to detect the scratches on the product surface from the product image based on machine vision technology. common blemishes
[0004] In view of the above situation, those skilled in the art often optimize the machine vision algorithm to improve the accuracy of flaw detection, but the optimization effect still does not meet the flaw detection needs of existing products with smooth surfaces

Method used

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  • Image acquisition device for flaw detection and flaw detection system
  • Image acquisition device for flaw detection and flaw detection system
  • Image acquisition device for flaw detection and flaw detection system

Examples

Experimental program
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Embodiment 1

[0041] Embodiment 1. An image acquisition device for defect detection, such as figure 1 As shown, it includes a detection box 4, an illumination module 1 and a camera module 2, and the object 3 to be detected is placed in the detection box 4;

[0042] The lighting module 1 and the camera module 2 are installed on the inner wall of the detection box 4, and the lighting module 1 and the camera module 2 are arranged opposite to each other;

[0043] The illumination direction of the lighting module 1 does not directly point to the upper surface of the object 3 to be detected, and the lighting module 1 illuminates the upper surface of the object 3 to be detected through the diffuse reflection of the inner wall of the detection box 4; that is, the light emitted by the lighting module 1 The upper surface of the object 3 to be detected is illuminated by the diffuse reflection of the inner wall of the detection box 4 , so that the camera module 2 can collect images of the object 3 to b...

Embodiment 2

[0080] Embodiment 2, a defect detection system, comprising a master controller and an image acquisition device for defect detection described in Embodiment 1 above, the master controller is connected to the image acquisition device with a signal, specifically the master controller and the image acquisition device The camera module 2 of the acquisition device is connected with signals. In actual work, the camera module 2 sends the collected images to the main controller, and the main controller detects defects on the images based on machine vision technology.

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Abstract

The invention discloses an image acquisition device for flaw detection, which comprises a detection box, a lighting module and a camera shooting module, wherein a to-be-detected object is placed in the detection box; the lighting module and the camera shooting module are mounted on the inner side wall of the detection box, and the lighting module and the camera shooting module are oppositely arranged; an irradiation direction of the lighting module does not directly point to the upper surface of the to-be-detected object, and the lighting module illuminates the upper surface of the to-be-detected object through diffuse reflection of the inner side walls of the detection box; and the camera shooting module is used for acquiring an image of the to-be-detected object. The design that the camera shooting module shoots the image of the to-be-detected object from the side surface overcomes the technical prejudice that a surface image of the to-be-detected object is acquired from the front surface in the field, and the design of the irradiation direction further overcomes the technical prejudice that a lighting module must irradiate an object to be detected in the field, and therefore a product image capable of highlighting scratches and other flaws is obtained.

Description

technical field [0001] The invention relates to the field of defect detection, in particular to an image acquisition device and a defect detection system for defect detection. Background technique [0002] As a big manufacturing country, our country is currently striving to create intelligent manufacturing 2025. Most products adopt the production method of conveyor belt assembly line in the production process. However, due to various objective factors in the product raw materials and processing There will be defects, such as damage, scratches, dark spots, etc. on the surface of the product. In order to improve the efficiency of defect detection, it is proposed to analyze the product image based on machine vision, so as to realize the defect detection on the product surface; [0003] In the prior art, the surface of the product is often photographed by the camera device. However, for products with a smooth surface and a certain texture on the surface, it is difficult to detec...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/88G01N21/01
CPCG01N21/01G01N21/88G01N21/8851G01N2021/0112
Inventor 钟国韵
Owner 钟国韵