Method for measuring two-phase mismatch degree based on X-ray energy scanning

Abstract

The invention discloses a method for measuring a two-phase mismatch degree based on X-ray energy scanning, and the method comprises the steps of irradiating the surface of a sample with an emission continuous spectrum X-ray, receiving a Laue diffraction pattern with total n diffraction peaks from the surface of the sample by an X-ray surface detector, calibrating the Laue diffraction pattern to obtain the Miller index of the ith diffraction peak, calculating the X-ray energy corresponding to each diffraction peak on the Laue diffraction pattern, scanning with the step size deltaE0 within the energy range E0-Et to E0+Et, measuring m different energies Ej, finding out the diffraction vector lengths with all values in the interval [dl, dl+deltad) in all the diffraction vector lengths |kj, j'|, obtaining the average value Iaver, l of intensity on the pixel points corresponding to these diffraction vector lengths, drawing r points in the plane rectangular coordinate system, fitting each ofthe points by using a bimodal fitting function to obtain the peak centers d1 and d2 from the peaks of the two phases in the sample, respectively, and calculating the amount theta of mismatch degree between the first and second phases of the sample.

Description

technical field [0001] The invention belongs to the technical field of measuring the coherent or semi-coherent two-phase mismatch degree of materials, in particular to a method for measuring the two-phase mismatch degree based on X-ray energy scanning. Background technique [0002] In view of the excellent properties of various coherent or semi-coherent dual-phase structure materials in terms of plasticity, toughness and high-temperature durability, coherent or semi-coherent dual-phase structures are often used in the design of modern alloys. For coherent or semi-coherent dual-phase structures, the degree of mismatch between the two phases has a significant impact on the mechanical properties of the material. In alloy design, different design indicators of mechanical properties can be achieved by adjusting the degree of mismatch between the two phases. The characteristics of coherent or semi-coherent duplexes determine that the degree of mismatch is generally extremely small...

AI Technical Summary

Problems solved by technology

For the monochromatic X-ray diffraction method, the measurement needs to continuously rotate the sample in two dimensions with a very small step size, which takes a long time

The converged electron beam diffraction method needs to be implemented in a transmission electron microscope, which has higher requirements on the sample, and because the thickness of the sample is extremely low, generally less than 100nm, its organizational structure and stress state between the two phases are different from those of bulk materials. The measurement results still need to be corrected by finite element simulation and other means

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