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Rapid three-dimensional measurement method based on double-frequency phase shift fringe projection

A technology of three-dimensional measurement and fringe projection, which is applied in the field of three-dimensional measurement, can solve problems such as slow measurement speed and unfavorable real-time measurement, and achieve the effect of improved speed and fast measurement speed

Inactive Publication Date: 2020-01-10
ANHUI AGRICULTURAL UNIVERSITY
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Problems solved by technology

However, the traditional dual-frequency phase-shift algorithm generally needs to project five or more fringe patterns, and the measurement speed is slow, which is not conducive to online real-time measurement

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  • Rapid three-dimensional measurement method based on double-frequency phase shift fringe projection
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  • Rapid three-dimensional measurement method based on double-frequency phase shift fringe projection

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Embodiment Construction

[0035] The present invention will be described in detail below, and the technical solutions in the embodiments of the present invention will be clearly and completely described. Apparently, the described embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0036] The present invention provides a kind of fast three-dimensional measuring method based on double-frequency phase-shift fringe projection by improving here, as Figure 1-Figure 5 As shown, the technical solution of the present invention is: a fast three-dimensional measurement method based on dual-frequency phase shift fringe projection,

[0037] Step S1: Build a structured light three-dimensional measurement system, including a projector, a camera, and a computer. The projec...

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Abstract

The invention relates to the technical field of three-dimensional measurement and particularly relates to a rapid three-dimensional measurement method based on double-frequency phase shift fringe projection. The method comprises the steps of (S1) building a structured light three-dimensional measurement system, (S2) generating four double-frequency phase shift stripes by using a computer, sequentially projecting all the double-frequency phase shift stripes to a surface of a measured object through a projector, and modulating the double-frequency phase shift stripes through the surface appearance of the measured object to generate deformed double-frequency phase shift stripes, (S3) allowing a camera to synchronously collecting all the deformed double-frequency phase shift stripes, transmitting all the deformed double-frequency phase shift stripes to the computer and respectively solving a high-frequency phase phi (x, y) and a low-frequency phase, (S4) unwrapping the high-frequency phasephi (x, y) by utilizing a low-frequency phase to obtain an absolute phase phi (x, y), and (S5) respectively measuring an absolute phase phi1 (x, y) of the measured object and an absolute phase phi2 (x, y) of the reference plane through the step (S4) and subtracting phi2 (x, y) from phi1 (x, y) to recover three-dimensional topography information of the measured object. Only four double-frequency phase shift stripes need to be projected, so the three-dimensional measurement speed is effectively improved, and the method is suitable for online real-time measurement.

Description

technical field [0001] The invention relates to the technical field of three-dimensional measurement, in particular to a fast three-dimensional measurement method based on dual-frequency phase shift fringe projection. Background technique [0002] Phase measurement profilometry has the advantages of non-contact measurement, low cost, accurate and fast, and has been a research hotspot in the field of three-dimensional measurement. The working principle of the system is as follows: first, the projector projects the fringe pattern onto the surface of the object, and the fringe is deformed due to the modulation of the object contour ; Then the camera collects the modulated fringe image, and transmits the image to the computer for fringe analysis, and calculates the absolute phase containing the object contour information; finally, the phase-to-height conversion is completed according to the triangulation principle to realize the three-dimensional measurement of the object contour...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/25
CPCG01B11/2527
Inventor 王玉伟刘路廖娟陈向成姜波洪继龙
Owner ANHUI AGRICULTURAL UNIVERSITY