Method, server and system for measuring three-dimensional shape of highly reflective surface

A technology of three-dimensional surface shape and measurement method, which is applied in the direction of measuring devices, instruments, optical devices, etc., to achieve the effect of simple operation, small amount of calculation, and guaranteed measurement accuracy and measurement speed

Inactive Publication Date: 2020-01-17
HUBEI UNIV OF TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] However, the above-mentioned methods all have deficienc

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  • Method, server and system for measuring three-dimensional shape of highly reflective surface
  • Method, server and system for measuring three-dimensional shape of highly reflective surface
  • Method, server and system for measuring three-dimensional shape of highly reflective surface

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Embodiment Construction

[0054] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0055] Such as figure 1 As shown, the embodiment of the present invention provides a method for measuring a three-dimensional surface shape of a highly reflective surface, including:

[0056] S1. Determine the optimal projected gray value based on the first surface image sequence of the measured object; the first surface image sequence of th...

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Abstract

The embodiment of the present invention provides a method, a server and a system for measuring a three-dimensional shape of a highly reflective surface. The optimal projection gray value is determinedby using a surface image sequence of a first measured object. A local overexposure problem easily occurring in the three-dimensional measurement process of the highly reflective surface is solved. According to the surface image of a second measured object and a phase unwrapping algorithm, coordinate matching between an image projection device and an image acquisition device can be carried out while reducing the overall projection intensity. An adaptive grating fringe image generated according to the optimal projection gray value has fewer projected fringe images; the operation is simpler; andthe calculation is less. Projecting to the surface of the measured object can prevent point cloud missing in an overexposed area during the three-dimensional reconstruction. Compared with the adaptive fringes generated by the traditional method, the modulation and contrast are better, and then the surface shape measurement accuracy and measurement speed of the measured object obtained by the three-dimensional reconstruction are ensured.

Description

technical field [0001] The invention relates to the technical field of three-dimensional surface shape measurement, and more specifically, to a method, server and system for measuring a three-dimensional surface shape of a highly reflective surface. Background technique [0002] Phase-shifting fringe projection technology has been widely used in academic research and industrial fields due to its advantages of full-field acquisition, non-contact, low cost, high precision and fast data processing. Digital projection grating technology based on digital projector (Digital Light Processing, DLP) and digital camera is also increasingly used in high-precision optical three-dimensional measurement. [0003] However, in the actual measurement process, due to the different materials of the measured objects, their surfaces will have different reflection characteristics, and the modulation effect of the grating stripes will be affected to varying degrees. Among them, the image oversatu...

Claims

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Application Information

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IPC IPC(8): G01B11/25G01B11/00
CPCG01B11/002G01B11/254
Inventor 冯维汤少靖赵晓冬赵大兴孙国栋吴贵铭刘红帝
Owner HUBEI UNIV OF TECH
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