Probe false touch prevention method, device and system
An anti-mistouch, probe technology, applied in the field of scanning imaging, can solve the problem of not being able to monitor the distance from the sample to the probe in real time
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Embodiment 1
[0043] like figure 1As shown, it is a schematic flowchart of the method for preventing accidental touch of a probe provided by Embodiment 1 of the present invention. This embodiment can be applied to an application scenario of probe scanning imaging of a near-field scanning imaging device, and the method can be executed by a control device, and the control device can be a server, a smart terminal, a tablet, a PC, or the like; in this embodiment of the present invention, the The control device is described as the execution subject, and the method specifically includes the following steps:
[0044] S110, adjusting the distance measuring light spot of the distance meter and the sample holder to the first test distance directly below the needle tip of the probe;
[0045] A near-field scanning imaging device that performs scanning imaging according to the principle of terahertz near-field imaging includes a sample holder for placing the sample, a probe for receiving terahertz ligh...
Embodiment 2
[0061] like figure 2 Shown is a schematic flowchart of the method for preventing accidental touch of a probe provided by the second embodiment of the present invention. On the basis of the first embodiment, this embodiment also provides a horizontal detection process of the sample holder and the sample during near-field scanning imaging, so as to prevent the probe from touching the sample during the scanning process. Specifically, the method includes:
[0062] S210, adjusting the distance measuring light spot and the sample holder of the distance meter to the first test distance directly below the needle tip of the probe;
[0063] In order to prevent the probe from touching the sample during the scanning process due to the unevenness of the sample holder, before the near-field scanning imaging device scans the sample, the ranging spot of the rangefinder and the sample holder can be adjusted to the position of the probe. Directly below the tip of the needle at the first test...
Embodiment 3
[0075] like image 3 Shown is a schematic flowchart of the method for preventing accidental touches of a probe provided by Embodiment 3 of the present invention. On the basis of Embodiment 1 or Embodiment 2, this embodiment also provides a method for preventing accidental contact of the probe during near-field scanning imaging, so as to prevent the probe from touching the sample during scanning. Specifically, the method includes:
[0076] S310. During the scanning and imaging process, measure the distance of each of the scanning points by the range finder to obtain the distance between each of the scanning points and the probe tip;
[0077] During the scanning imaging process, the ranging spot of the rangefinder and the sample holder are located at the scanning distance directly below the tip of the probe; and during the scanning process, the control device controls the movement of the sample placed on the sample holder through the motor. Move point by point. The control de...
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Abstract
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