Heating device and heating control system for testing high-temperature parameters of power device
A technology for parameter testing and power devices, applied in induction heating control, single semiconductor device testing, measuring devices, etc., can solve the problems of personnel safety threats, easy burns for operators, poor temperature balance of the overall platform, etc., to achieve good temperature balance Effect
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[0029] Hereinafter, the heating device and heating control system for testing high temperature parameters of power devices according to the present invention will be described in detail with reference to the accompanying drawings and exemplary embodiments.
[0030] One aspect of the present invention provides a heating device for testing high temperature parameters of power devices.
[0031] In an exemplary embodiment of the invention, the heating device may include a first heating layer, a heat resistance test layer and a second heating layer. The first heating layer, the heat-resistant test layer and the second heating layer are arranged sequentially from bottom to top, and from a top view, the three can overlap each other. The first heating layer is provided with a first heating assembly, the heat-resistant test layer is used to place the object to be tested, and the second heating layer is provided with a second heating assembly.
[0032] Specifically, the first heating l...
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