Dirty filament defect detection method for packaged filaments

A defect detection and filament technology, applied in image data processing, instruments, calculations, etc., can solve problems such as the impact of packaged filaments, increase production labor costs, and lack of unified quality standards, to reduce production costs and improve detection. Efficiency, the effect of reducing the false detection rate

Pending Publication Date: 2020-03-03
DONGHUA UNIV
View PDF0 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Due to the deformability, multi-curved surface, and large inspection surface of packaged filament, it is difficult to extract uniform standards for its appearance defect characteristics. The appearance inspection of packaged filament has always affected the realization of intelligent manufacturing in the long production process. Defect detecti

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Dirty filament defect detection method for packaged filaments
  • Dirty filament defect detection method for packaged filaments
  • Dirty filament defect detection method for packaged filaments

Examples

Experimental program
Comparison scheme
Effect test

Example Embodiment

[0047] The structure and working principle of the embodiments of the present invention will be further described below with reference to the accompanying drawings.

[0048] like figure 1 As shown, a method for detecting filth defects in packaged filaments according to an embodiment of the present invention includes:

[0049] S110, acquiring a plurality of captured images of the to-be-detected area of ​​the packaged filament;

[0050] S120, intercepting the target image corresponding to the inspected position in the area to be inspected in the captured image;

[0051] S130. Determine a suspected area in the target image, and obtain grayscale feature parameters of the suspected area;

[0052] S140 Determine the irregular geometric figure corresponding to the suspected area, and obtain the geometric feature parameters of the irregular geometric figure;

[0053] S150, according to the grayscale feature parameter and the geometric feature parameter, determine whether the package...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a dirty filament defect detection method for a packaged filament. The method comprises the following steps: acquiring a plurality of acquired images of a to-be-detected area ofthe packaged filament; intercepting a target image corresponding to the detected position in the to-be-detected area in the acquired image; determining a suspected area in the target image, and obtaining gray feature parameters of the suspected area; determining an irregular geometric figure corresponding to the suspected area, and obtaining geometric feature parameters of the irregular geometricfigure; and determining whether the packaged filament has a dirty filament defect or not according to the gray feature parameters and the geometrical feature parameters. According to the dirty filament defect detection method for the packaged filament, the error rate of manual visual inspection can be reduced, the detection efficiency is improved, and the production cost can be saved.

Description

technical field [0001] The invention relates to the technical field of surface detection of packaged filaments, in particular to a detection method for dirty filament defects of packaged filaments. Background technique [0002] The packaged filament is a packaged product with a certain shape and capacity made by the filament through a winding mechanism during the production process. The defects of packaged filaments are mainly divided into two parts: physical and chemical property defects of filaments and appearance defects of packaged filaments. Through practical production, it is found that the appearance defects of packaged filaments have an extremely important impact on the quality of the fabric, which will lead to a decrease in the yield of the fabric. Therefore, in the production process, it is necessary to strengthen the detection of appearance defects of packaged filaments. [0003] The dirty filament of the packaged filament is caused by the contamination of the p...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G06T7/00G06T7/13G06T7/194G06T5/00G06T5/30G06T7/62
CPCG06T7/0008G06T7/13G06T7/194G06T5/002G06T5/30G06T7/62G06T2207/10004G06T2207/30108
Inventor 杨崇倡肖凌云冯培张荣根宋洪征
Owner DONGHUA UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap