Integrated circuit repair algorithm determination method and device, storage medium and electronic equipment

Abstract

The invention relates to the technical field of computers, in particular to an integrated circuit repair algorithm determination method and device, a storage medium and electronic equipment. The method comprises the steps of obtaining failure test unit data of a to-be-repaired integrated circuit; acquiring a failure unit distribution type of the to-be-repaired integrated circuit according to the failure test unit data in combination with a type analysis model constructed by a deep learning network; According to the failure unit distribution type, obtaining a repair performance index of each candidate repair algorithm for the failure unit distribution type in a repair algorithm library, and determining the candidate repair algorithm with the optimal repair performance index as a target repair algorithm. According to the invention, the repair of each to-be-repaired integrated circuit can reach the highest repair rate, the minimum use number of the repair circuits, the shortest repair analysis time and the like, the repair efficiency and accuracy are improved, and the repair cost is reduced.

Description

technical field [0001] The present disclosure relates to the field of computer technology, and in particular to a method and device for determining an integrated circuit repair algorithm, a storage medium, and electronic equipment. Background technique [0002] At present, in the production process of the integrated circuit, it is necessary to test the integrated circuit to obtain test data, and judge whether the integrated circuit passes the test by judging whether the test data contains failure test unit data. In order to improve the production yield, for the integrated circuit that fails the test, that is, when there is failed test unit data in the test data, the patch solution information of the integrated circuit can be generated by combining the failed test unit data in the test data with the repair algorithm, And the integrated circuit is repaired according to the repairing solution information. [0003] In the existing repairing process, the same repairing algorithm...

AI Technical Summary

Problems solved by technology

[0006] The purpose of the present disclosure is to provide a method and device for determining an integrated circuit repair algorithm, a storage medium, and an electronic device, thereby at least to a certain extent overcoming the inability to achieve a repair rate for each integrated circuit due to the use of the same repair algorithm Highest, least number of patched circuits used, shortest patch analysis time, etc.

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