Integrated circuit repair algorithm determination method and device, storage medium and electronic equipment

An integrated circuit and a technology for determining methods, applied in the computer field, can solve problems such as short repair analysis time and small number of repair circuits

Active Publication Date: 2020-04-07
CHANGXIN MEMORY TECH INC
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  • Claims
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Problems solved by technology

[0006] The purpose of the present disclosure is to provide a method and device for determining an integrated circuit repair algorithm, a storage medium, and an electronic device, thereby at least to a certain e

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  • Integrated circuit repair algorithm determination method and device, storage medium and electronic equipment
  • Integrated circuit repair algorithm determination method and device, storage medium and electronic equipment
  • Integrated circuit repair algorithm determination method and device, storage medium and electronic equipment

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Embodiment Construction

[0047] Example embodiments will now be described more fully with reference to the accompanying drawings. Example embodiments may, however, be embodied in many forms and should not be construed as limited to the embodiments set forth herein; rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the concept of example embodiments to those skilled in the art. The same reference numerals denote the same or similar parts in the drawings, and thus their repeated descriptions will be omitted.

[0048]Furthermore, the described features, structures, or characteristics may be combined in any suitable manner in one or more embodiments. In the following description, numerous specific details are provided in order to give a thorough understanding of embodiments of the present disclosure. However, those skilled in the art will appreciate that the technical solutions of the present disclosure may be practiced without one or mor...

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Abstract

The invention relates to the technical field of computers, in particular to an integrated circuit repair algorithm determination method and device, a storage medium and electronic equipment. The method comprises the steps of obtaining failure test unit data of a to-be-repaired integrated circuit; acquiring a failure unit distribution type of the to-be-repaired integrated circuit according to the failure test unit data in combination with a type analysis model constructed by a deep learning network; According to the failure unit distribution type, obtaining a repair performance index of each candidate repair algorithm for the failure unit distribution type in a repair algorithm library, and determining the candidate repair algorithm with the optimal repair performance index as a target repair algorithm. According to the invention, the repair of each to-be-repaired integrated circuit can reach the highest repair rate, the minimum use number of the repair circuits, the shortest repair analysis time and the like, the repair efficiency and accuracy are improved, and the repair cost is reduced.

Description

technical field [0001] The present disclosure relates to the field of computer technology, and in particular to a method and device for determining an integrated circuit repair algorithm, a storage medium, and electronic equipment. Background technique [0002] At present, in the production process of the integrated circuit, it is necessary to test the integrated circuit to obtain test data, and judge whether the integrated circuit passes the test by judging whether the test data contains failure test unit data. In order to improve the production yield, for the integrated circuit that fails the test, that is, when there is failed test unit data in the test data, the patch solution information of the integrated circuit can be generated by combining the failed test unit data in the test data with the repair algorithm, And the integrated circuit is repaired according to the repairing solution information. [0003] In the existing repairing process, the same repairing algorithm...

Claims

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Application Information

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IPC IPC(8): G06F30/398G06N3/08
CPCG06N3/08
Inventor 汪锡
Owner CHANGXIN MEMORY TECH INC
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