Test piece and test contactor comprising same

A technology of test piece and contact surface, which is applied in the direction of semiconductor/solid-state device testing/measurement, contact parts, connection, etc., can solve the problem of contact failure between test piece and product pin, achieve simple structure, low cost, and improve pass rate Effect

Inactive Publication Date: 2020-04-07
四川峰哲精密设备有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] One of the purposes of the present invention is to provide a test piece to solve the problem of contact failure between the test piece and product pins when testing semiconductor products.

Method used

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  • Test piece and test contactor comprising same
  • Test piece and test contactor comprising same

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0018] A test piece, the test piece includes a guide body 1, a test piece head 2, an arc-shaped elastic region 3, a mounting bracket 4 and a test board contact surface 5, the guide body 1 and the test piece head 2 arranged above the guide body 1 ; The guide body is provided with an arc-shaped elastic area 3, the arc-shaped elastic area 3 is provided with a mounting bracket 4, and the mounting bracket is provided with a test board contact surface 5.

[0019] The test piece of the present invention is used to contact with the product pin and press down to make the arc elastic zone of the test piece produce deformation for testing. The test contact surface on the test chip head is in contact with the pins, thus greatly reducing the problem of contact failure between the test chip and the product pins, thereby improving the accuracy of product test results and improving the pass rate of products.

Embodiment 2

[0021] Such as figure 2 As shown, the test contactor of the present invention includes a test contact piece substrate 7 on which at least one test piece as described in Embodiment 1 is provided. The mounting bracket 4 of the test piece is fixed on the test contact piece substrate 7 .

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PUM

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Abstract

A test piece is characterized by comprising a guide body (1), a test piece head (2) arranged above the guide body (1), an arc-shaped elastic area, an installation support and a test plate contact surface. The guide body (1) is provided with the arc-shaped elastic area (3), the arc-shaped elastic area (3) is provided with the installation support (4), and the installation support (4) is provided with the test board contact surface (5). The test piece is simple in structure, the cost is low, when the test piece is in contact with a pin of a product, the testing contact surface on the head of thetest piece is in contact with the pin due to continuous elastic force generated by the arc-shaped elastic area of the test piece, so that the problem of contact failure of the test piece and the pinof the product is greatly reduced, the accuracy of a product test result is improved, the product percent of pass is improved, and the test piece is suitable for popularization and application.

Description

technical field [0001] The invention relates to a mechanical structure for semiconductor product testing, in particular to a testing contactor composed of it. Background technique [0002] Before the semiconductor product manufacturing process is completed, it needs to enter the final test stage. The final test is to use the matching between the test machine (Tester), sorter (Handler), test board (DUT Board) and test contactor (Test Contactor) Combination to test each product, the test line of the tester is connected to the line on the test board, the line on the test board is connected to one end of the test piece of the test contactor, and the other end of the test piece is directly connected to the pin of the semiconductor product Contact, and then test the product. During the manufacturing process, burrs are easily generated on the contact surface between the pin and the test piece, and at the same time, the contact surface of the pin is also prone to irregular surfaces...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/66H01R13/02H01R13/24
CPCH01L22/14H01R13/02H01R13/2407
Inventor 周峰
Owner 四川峰哲精密设备有限公司
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