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Chip and efficiency monitoring method

A chip and performance technology, applied in the field of chip and performance monitoring with built-in test circuit, can solve the problem that the critical path cannot be determined accurately, and achieve the effect of accurate estimation

Active Publication Date: 2020-05-05
GLOBAL UNICHIP CORPORATION +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, due to variations introduced by actual operating conditions or processes, the true critical path cannot be accurately determined

Method used

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  • Chip and efficiency monitoring method
  • Chip and efficiency monitoring method
  • Chip and efficiency monitoring method

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Embodiment Construction

[0016] All terms used herein have their ordinary meanings. The definitions of the above-mentioned words in commonly used dictionaries, and the use examples of any words discussed here in the content of this specification are only examples, and should not limit the scope and meaning of the disclosure. Likewise, the disclosure is not limited to the various embodiments shown in this specification.

[0017] It is understandable that terms such as first, second and third are used herein to describe various elements, components, regions, layers and / or blocks. But these elements, components, regions, layers and / or blocks should not be limited by these terms. These terms are limited to identifying a single element, component, region, layer and / or block. Therefore, a first element, component, region, layer and / or block hereinafter may also be referred to as a second element, component, region, layer and / or block without departing from the original meaning of the present application. ...

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Abstract

The invention discloses a chip and an efficiency monitoring method. The chip comprises at least one oscillator circuit system and a controller circuit system. At least one oscillator circuit system isarranged at different positions in the chip and generates a plurality of oscillation signals respectively. The controller circuit system transmits the oscillation signals to an external system so asto determine the efficiency of the chip according to the oscillation signals. Each of the at least one oscillator circuitry includes a first oscillator circuit and a second oscillator circuit. The first oscillator circuit senses semiconductor device variations within the chip to generate a first one of the oscillation signals. A second oscillator circuit senses parasitic element variations withinthe chip to generate a second one of the oscillation signals. The chip can determine the efficiency according to the frequencies of a plurality of oscillation signals generated in the chip, and the plurality of oscillation signals are set to reflect various variation factors (devices, resistance values, voltages and the like), so that the efficiency of the chip can be estimated more accurately.

Description

technical field [0001] This case relates to a chip (chip) and a performance monitoring method, and especially relates to a chip with a built-in test circuit and a performance monitoring method. Background technique [0002] Integrated circuits are widely used in electronic devices, and the performance of integrated circuits often determines the overall performance of electronic devices. In some related arts, the performance of integrated circuits can be determined by estimating critical paths. However, due to variations introduced by actual operating conditions or processes, the true critical path cannot be accurately determined. Contents of the invention [0003] In order to solve the above problems, some aspects of the present application provide a chip including at least one oscillator circuit system and a controller circuit system. At least one oscillator circuit system is arranged at different positions in the chip, and is used to generate a plurality of oscillation...

Claims

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Application Information

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IPC IPC(8): G01R31/28
CPCG01R31/2851
Inventor 汪鼎豪林倍如
Owner GLOBAL UNICHIP CORPORATION