Unlock instant, AI-driven research and patent intelligence for your innovation.

Hardware-in-loop test method and device

A test method and test device technology, applied in the direction of instruments, simulators, control/regulation systems, etc., can solve problems such as low efficiency, high test cost, and inability to provide customized road map information, so as to reduce costs and test flexibly , is conducive to the effect of reproducing the scene

Pending Publication Date: 2020-05-08
BEIJING JINGWEI HIRAIN TECH CO INC
View PDF12 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] First of all, the method of using the map box to provide high-precision map signals strongly depends on the normal work of the map box, the map provider and the GPS (Global Positioning System, Global Positioning System), and requires real vehicles to drive on real roads to provide high-precision maps signal, making the test costly and inefficient
Secondly, the map box can only provide real and existing road information, but cannot provide custom road map information. For example, if you want to test a road with a specific custom working condition, it is difficult to find the road in the real map
Thirdly, when the map box reproduces the working conditions, due to the different driving environments, it is difficult to repeatedly test the same scene. For example, when testing the scene of driving the leftmost lane, it is difficult to repeatedly drive the leftmost lane forcibly, which is not conducive to driving safety.
In addition, in the existing method, the high-precision map signal that can reproduce the working conditions is provided in the way of replaying the message, but the way of replaying the message can only simply play the message. During the test of the driving system, the content of the message is not It will change with the movement of the controller or the vehicle model. For example, the content of the map message will not be updated according to the new position of the vehicle changing lanes. Therefore, it is not possible to test the real vehicle response effect of the driving system in a closed loop. Therefore, for complex Real-time vehicle control HIL test is not applicable

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Hardware-in-loop test method and device
  • Hardware-in-loop test method and device
  • Hardware-in-loop test method and device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0030] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. All other embodiments obtained by persons of ordinary skill in the art based on the embodiments of the present invention belong to the protection scope of the present invention.

[0031] figure 1 is a schematic diagram of a hardware-in-the-loop testing device based on a high-precision map according to an embodiment of the present invention. Such as figure 1 As shown, the host computer 210 is responsible for programming control. In the programming control part, the functional modules of a general hardware-in-the-loop test system may include a vehicle dynamics module 211 and a first IO configuration module 213, and may also include a road definition and rendering modul...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a hardware-in-loop test method and device. The method comprises the following steps: receiving a vehicle position signal; determining a virtual map signal required for testingaccording to a preset vehicle driving prospective distance and the vehicle position signal; sending the virtual map signal required for testing and the vehicle simulation signal to a lower computer, enabling the lower computer to test a to-be-tested piece, and enabling functional modules operated in the upper computer to comprise a map signal simulation module that is pre-configured; recording thevirtual map signal required for testing in a map signal simulation module. According to the technical scheme, the method at least does not depend on a map box, a real vehicle does not need to be tested on a real road, so that the cost is reduced.

Description

technical field [0001] The invention relates to the technical field of intelligent driving simulation testing, in particular to a hardware-in-the-loop testing method and device. Background technique [0002] In the existing high-precision map HIL (Hardware-in-the-Loop, hardware-in-the-loop) test, the high-precision map signal is generally provided by the map box or message playback, and then the response of the device under test is tested. [0003] However, existing testing methods have the following problems: [0004] First of all, the method of using the map box to provide high-precision map signals strongly depends on the normal work of the map box, the map provider and the GPS (Global Positioning System, Global Positioning System), and requires real vehicles to drive on real roads to provide high-precision maps signal, making the test costly and inefficient. Secondly, the map box can only provide real and existing road information, but cannot provide custom road map in...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G05B17/02
CPCG05B17/02
Inventor 廖琳静谷雨
Owner BEIJING JINGWEI HIRAIN TECH CO INC
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More