Testing device of photovoltaic junction box

Abstract

The invention discloses a testing device of a photovoltaic junction box. The device is applied to the photovoltaic junction box connected with a sub-string MOS tube between a first PV end and a secondPV end, and comprises a first testing module and a second testing module. A first end of the first testing module is connected with the first PV end of the to-be-tested junction box; and a second endof the first testing module is connected with the second PV end of the to-be-tested junction box, a voltage between the first PV end and the second PV end is changed to simulate a fault condition ofa battery substring, and a bypass function of the to-be-tested junction box can be detected by detecting whether the substring MOS tube is conducted or not. The first end of the second testing moduleis connected with an OUT+ end of the to-be-tested junction box; and the second end of the second test module is connected with an OUT- end of the to-be-tested junction box, the voltage between the OUT+ end and the OUT- end is changed to simulate a situation that the to-be-tested junction box needs to be turned off, and a turn-off function of a main MOS tube of the to-be-tested junction box can bedetected by detecting whether the main MOS tube is turned on or not.

Description

technical field [0001] The invention relates to the technical field of component testing, in particular to a testing device for a photovoltaic junction box. Background technique [0002] Photovoltaic junction box is a connection device between the solar cell square array composed of solar cell components and the solar charging control device. Its main function is to connect and protect solar photovoltaic components, connect the power generated by solar cells with external lines, and conduct photovoltaic current generated by the component. [0003] Traditional photovoltaic junction boxes usually use bypass diodes, which are turned on when the current of a certain battery substring is small, and the battery substring is bypassed to avoid hot spots. However, due to the diversity of solar panel installation locations, the solar panel may be shaded during operation, which will induce the activation of the bypass protection element (usually a diode) in the junction box behind the...

AI Technical Summary

Problems solved by technology

However, due to the diversity of solar panel installation locations, the solar panel may be shaded during operation, which will induce the activation of the bypass protection element (usually a diode) in the junction box behind the panel, and the battery string A DC current of up to about 9A will be instantly loaded on the bypass device, causing a high temperature of more than 100 degrees in the junction box. This high temperature will have little effect on the battery board and junction box in the short term, but if the shadow effect is not eliminated If it exists for a long time, it will seriously affect the service life of the junction box and the battery board

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