Automatic testing machine for electronic product aging detection
An automatic testing machine and electronic product technology, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve the problems of low work efficiency, high cost, and many equipment, and achieve the effect of high degree of automation and high work efficiency
Inactive Publication Date: 2020-05-19
贝明
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Problems solved by technology
[0004] The object of the present invention is to provide an automatic testing machine for electronic product aging detection, to solve the problem that the existing electronic product aging test proposed in the above background technology is mostly divided into multiple steps, the work efficiency is low, and many devices need to be used. high cost problem
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[0030] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. The specific embodiments described here are only used to explain the present invention, not to limit the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0031] The present invention provides such Figure 1-8 The shown automatic testing machine for aging detection of electronic products includes a frame 1, the upper end of the frame 1 is connected with a low-temperature pipeline 2 in the middle, and the lower end of the low-temperature pipeline 2 runs through a sealing cover 3, and the sea...
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The invention discloses an automatic testing machine for electronic product aging detection. The automatic testing machine comprises a rack. The rack is communicated with a low-temperature pipeline; the lower end of the low-temperature pipeline penetrates through a sealing cover; a testing mechanism is arranged in the sealing cover; an unqualified product recycling mechanism is arranged on one side of the testing mechanism; a CCD coupling mechanism is arranged on the rear side of the testing mechanism; a feeding mechanism is arranged on the left side of the sealing cover; a discharging mechanism is arranged on the right side of the sealing cover; the feeding mechanism and the discharging mechanism are the same in structure, a power source is installed at the upper end of the interior of the rack, the power source is electrically connected with a spectrograph, the spectrograph is installed at the top end of the interior of the rack, the power source is electrically connected with a computer control screen, and the computer control screen is installed at the outer end of one side of the rack. By means of the structure, automatic feeding, detecting and discharging of electronic product aging tests are achieved, the unqualified products are automatically taken out and collected and the automation degree is high.
Description
technical field [0001] The invention belongs to the technical field of electronic product aging detection devices, and in particular relates to an automatic testing machine for electronic product aging detection. Background technique [0002] Generally speaking, electronic devices, whether they are originals, components, parts, complete machines, etc., need to undergo aging tests. The aging test is aging first and then testing in the process. After the electronic device is used, for example, a dozen hours, a month, a year, or three years later, various faults may be found. These faults cannot be detected in the test without certain aging settings. Therefore, in order to avoid these problems that may occur in the subsequent use of electronic products, many domestic or foreign standards stipulate that aging tests must be carried out in the testing of electronic appliances. The aging test is completed by the manufacturer or a first-class electronic and electrical testing tech...
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IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 贝明
Owner 贝明