Optical device and optical chip loss testing device and method

A test device and test method technology, applied in the direction of optical instrument test, machine/structural component test, measuring device, etc., can solve the problems of inability to accurately calibrate the optical loss of the optical device and optical chip under test, and achieve accurate solution The effect of the test

Active Publication Date: 2020-06-09
北京爱杰光电科技有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Optical components such as optical fibers, optical couplers, and optical waveguides in test devices on the market have a certain impact on test results, and cannot accurately calibra

Method used

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  • Optical device and optical chip loss testing device and method
  • Optical device and optical chip loss testing device and method
  • Optical device and optical chip loss testing device and method

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Embodiment Construction

[0045] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0046] The embodiment of the present invention discloses an optical device and an optical chip loss testing device, which is characterized in that it includes a microring resonance system, an input system, and an output system;

[0047] The input system includes a first optical fiber 1 and a first optical coupler 3;

[0048] The output system includes a second optical fiber 2, a second optical coupler 5, and a third optical coupler 7;

[0049] One end of the ...

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Abstract

The invention relates to the field of optical loss testing, and discloses an optical device, and an optical chip loss testing device and method. The system comprises a micro-ring resonance system, aninput system and an output system, the input system comprises a first optical fiber and a first optical coupler, the output system comprises a second optical fiber, a second optical coupler and a third optical coupler, one end of the first optical coupler is connected with the first optical fiber, and the other end of the first optical coupler is connected with the micro-ring resonance system; thesecond optical coupler is arranged at the uplink end of the micro-ring resonance system, one end of the second optical coupler is connected with a second optical fiber, and the other end of the second optical coupler is connected with the micro-ring resonance system; and the third optical coupler is arranged at the downlink end of the micro-ring resonance system, one end of the third optical coupler is connected with the second optical fiber, and the other end of the third optical coupler is connected with the micro-ring resonance system. The tested optical device and the optical chip are nested into the micro-ring resonance system, so that the test accuracy, stability and flexibility are improved.

Description

technical field [0001] The invention relates to the field of optical loss testing, and more specifically relates to an optical device and an optical chip loss testing device and method. Background technique [0002] Optical loss is an important parameter index to measure the performance of optical devices and optical chips, and determines the application scenarios of optical devices and optical chips. Typical optical test setups require perfect alignment of the fiber and optical coupler, requiring the fiber to be at the same physical location for each test. Optical components such as optical fibers, optical couplers, and optical waveguides in test devices on the market have a certain impact on test results, and cannot accurately calibrate the optical loss of the optical device and optical chip under test. Therefore, it is urgent to invent a test with high precision. , high stability and high flexibility test device. Contents of the invention [0003] In view of this, the...

Claims

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Application Information

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IPC IPC(8): G01M11/02
CPCG01M11/0292
Inventor 周治平杨丰赫
Owner 北京爱杰光电科技有限公司
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