Composition analysis device and composition analysis method
A defect detection and subsystem technology, applied in the field of detection, can solve problems such as not necessarily good results, difficult glue and background, and large calculation time, and achieve the effect of improving the acquisition method, high efficiency and accuracy
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[0036] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.
[0037] The optical reflection characteristics of an object refer to the characteristics of the object's ability to reflect electromagnetic waves. When objects of different materials or objects of the same material have different colors or surface structures, their reflection characteristics are also different. The polarization state of the light waves reflected and scattered from the surface of the object will change. Change, the light wave carries a lot of detailed...
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