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Distance determination of a sample plane in a microscope system

A microscope system and distance technology, applied in the field of microscope systems, can solve problems such as inaccurate calibration and unknown bottom thickness, achieve a large application field and avoid damage to the microscope system

Active Publication Date: 2020-06-30
CARL ZEISS MICROSCOPY GMBH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This could be due to an unknown base thickness of the sample carrier, the use of different stage inserts with different heights, or an imprecise alignment in the z-direction (direction of the optical axis from the microscope objective to the sample)

Method used

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  • Distance determination of a sample plane in a microscope system
  • Distance determination of a sample plane in a microscope system
  • Distance determination of a sample plane in a microscope system

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Embodiment Construction

[0054] In the context of this specification, conventions, terms and / or expressions should be understood in the following ways:

[0055] The term "distance determination system" in the context of this document refers to automated systems based on machine learning for distance determination, in particular classification systems for recorded images of microscope systems for image segmentation and displacement vector determination. The distance determination system can be integrated with its individual components into the microscope system and / or use already existing subcomponents of the microscope system.

[0056] The term "coarse focus setting" refers herein to the automatic setting of the distance between a reference point on the objective lens of the microscope system and the sample plane of the sample carrier located on the sample stage. After a rough setup by the concepts described here, a further control system can be used for further fine focusing by the corresponding obje...

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Abstract

A distance determination system for a microscope system for coarse focus setting is introduced and includes a sample stage with a placement surface for holding a sample carrier which is displaceable along at least one direction of extent of a sample plane; an overview camera with a non-telecentric objective for producing digital images, directed at the sample stage; and an evaluation unit, which includes a storage system storing at least two recorded digital images of the sample stage at different viewing angles; a trained machine-learning-based system for identifying corresponding structuresof a sample carrier that has been placed into the sample stage in the two recorded digital images; and a distance determination unit, which is adapted for determining the distance of a reference pointof the sample carrier from a reference point of the overview camera based on the different viewing angles onto the sample stage, a pixel distance of the two recorded digital images with respect to one another using the associated corresponding structures contained in the recorded images.

Description

technical field [0001] The present invention relates generally to microscope systems and in particular to a distance determination system for a microscope system with a coarse focus setting, a corresponding method and a computer program product. Background technique [0002] Modern high-performance microscopes are used in more and more sectors of industry to analyze small structures. The inspection process in question is usually carried out manually, but in some cases is fully automated. Ergonomic requirements for microscope systems are constantly increasing. In many cases, a combination of optics and electronics is used today to observe small structures, not only by optical means, but often image sensors (e.g. in the form of image area sensors) are used to directly further process the observed electronically structures (such as samples more likely in the medical or biological domain) and store or display them on large monitors. In the case of conventional structures such...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G02B21/36G02B21/06G01B11/14G06N20/00
CPCG02B21/361G02B21/06G06N20/00G01B11/14G01C11/10G02B21/006G02B21/26G02B21/367G01C11/02G01C11/06
Inventor M·阿姆托尔D·哈泽
Owner CARL ZEISS MICROSCOPY GMBH